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科研机构
高能物理研究所 [4]
湖南大学 [4]
北京航空航天大学 [2]
新疆理化技术研究所 [1]
内容类型
期刊论文 [10]
会议论文 [1]
发表日期
2019 [11]
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Development of a new high-speed readout system for soi pixel detectors
期刊论文
Nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 2019, 卷号: 924, 页码: 480-484
作者:
Nishimura, Ryutaro
;
Arai, Yasuo
;
Miyoshi, Toshinobu
;
Hirano, Keiichi
;
Kishimoto, Shunji
收藏
  |  
浏览/下载:59/0
  |  
提交时间:2019/04/22
Soi
Pixel detector
Daq
Fpga
X-ray imaging
A prototype soi pixel sensor for cepc vertex
期刊论文
Nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 2019, 卷号: 924, 页码: 409-416
作者:
Wu, Zhigang
;
Lu, Yunpeng
;
Zhou, Yang
;
Dong, Jing
;
Song, Longlong
收藏
  |  
浏览/下载:98/0
  |  
提交时间:2019/04/22
Soi pixel sensor
Cepc
Vertex detector
A prototype soi pixel sensor for cepc vertex
期刊论文
Nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 2019, 卷号: 924, 页码: 409-416
作者:
Wu, Zhigang
;
Lu, Yunpeng
;
Zhou, Yang
;
Dong, Jing
;
Song, Longlong
收藏
  |  
浏览/下载:98/0
  |  
提交时间:2019/04/22
Soi pixel sensor
Cepc
Vertex detector
Development of a new high-speed readout system for soi pixel detectors
期刊论文
Nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 2019, 卷号: 924, 页码: 480-484
作者:
Nishimura, Ryutaro
;
Arai, Yasuo
;
Miyoshi, Toshinobu
;
Hirano, Keiichi
;
Kishimoto, Shunji
收藏
  |  
浏览/下载:59/0
  |  
提交时间:2019/04/22
Soi
Pixel detector
Daq
Fpga
X-ray imaging
Total Ionizing Dose Responses of Forward Body Bias Ultra-Thin Body and Buried Oxide FD-SOI Transistors
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 4, 页码: 702-709
作者:
Zheng, QW (Zheng, Qiwen)[ 1 ]
;
Cui, JW (Cui, Jiangwei)[ 1 ]
;
Xu, LW (Xu, Liewei)[ 2 ]
;
Ning, BX (Ning, Bingxu)[ 3 ]
;
Zhao, K (Zhao, Kai)[ 3 ]
收藏
  |  
浏览/下载:101/0
  |  
提交时间:2019/05/14
Back-gate biasing
forward body bias (FBB)
total ionizing dose (TID)
ultrathin body and buried oxide fully depleted silicon-on-insulator (UTBB FD-SOI)
Low-Power, High-Sensitivity Temperature Sensor Based on Ultrathin SOI Lateral p-i-n Gated Diode
期刊论文
IEEE Transactions on Electron Devices, 2019, 卷号: Vol.66 No.9, 页码: 4001-4007
作者:
Guoli Li
;
Nicolas André
;
Qi Chen
;
Huiru Wang
;
Laurent A. Francis
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/13
Temperature sensors
P-i-n diodes
Sensitivity
Temperature measurement
Logic gates
Linearity
Linearity
low power
p-i-n diode
sensitivity
SOI
thermal sensing (temperature sensor)
A Snapback-Free and Low-Loss Shorted-Anode SOI LIGBT With Self-Adaptive Resistance
期刊论文
IEEE Transactions on Electron Devices, 2019, 卷号: Vol.66 No.3, 页码: 1390-1395
作者:
Xiaorong Luo
;
Yang Yang
;
Tao Sun
;
Jie Wei
;
Diao Fan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/12/17
Anodes
Resistance
Current density
Silicon-on-insulator
Insulated gate bipolar transistors
Spontaneous emission
Sun
Low-loss
p-type polysilicon
self-adaptive resistance (SAR)
shorted-anode (SA)
snapback-free
silicon on insulator lateral insulated gate bipolar transistor (SOI LIGBT)
Low-Power, High-Sensitivity Temperature Sensor Based on Ultrathin SOI Lateral p-i-n Gated Diode
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 卷号: Vol.66 No.9, 页码: 4001-4007
作者:
Li, GL
;
Andre, N
;
Chen, Q
;
Wang, HR
;
Francis, LA
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/12/17
Linearity
low power
p-i-n diode
sensitivity
SOI
thermal sensing (temperature sensor)
Compact Model for Tunnel Diode Body Contact SOI n-MOSFETs
期刊论文
IEEE Transactions on Electron Devices, 2019, 卷号: Vol.66 No.1, 页码: 249-254
作者:
Yongwei Chang
;
Jiexin Luo
;
Jing Chen
;
Lingda Xu
;
Zhan Chai
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/13
MOSFET
circuits
Integrated
circuit
modeling
Semiconductor
device
modeling
Radio
frequency
MOSFET
Analytical
models
Mathematical
model
Body
contact
compact
model
floating
body
effects
(FBEs)
impact
ionization
partially
depleted
silicon-on-insulator
(PD-SOI)
radio
frequency
(RF)
tunnel
diode
body
contact
(TDBC)
Numerical and Experimental Investigation of TID Radiation Effects on the Breakdown Voltage of 400-V SOI NLDMOSFETs
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 页码: 710-715
作者:
Shu, Lei
;
Wang, Liang
;
Zhou, Xin
;
Li, Tong-De
;
Yuan, Zhang-Yi'an
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/12/30
400-V silicon-on-insulator (SOI) n-channel laterally diffused metal-oxide-semiconductor field-effect transistor (NLDMOSFET)
BVDS variations
laterally diffused metal-oxide-semiconductor (LDMOS)
radiation effects
SOI
technology computer-aided design (TCAD) simulations
total ionizing dose (TID)
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