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CORC

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Performance evaluation of silicon-chip-based mid-infrared Kerr optical frequency combs with ridge cross section 期刊论文
Optik, 2022, 卷号: 266
作者:  Wen, Jin;  Qin, Weijun;  Sun, Wei;  He, Chenyao;  Xiong, Keyu
收藏  |  浏览/下载：19/0  |  提交时间：2022/08/18
1/f Noise responses of Ultra-Thin Body and Buried oxide FD-SOI PMOSFETs under total ionizing dose irradiation 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2022, 卷号: 176, 期号: 11-12, 页码: 1202-1214
作者:  Zhang, RQ (Zhang, Ruiqin) [1] , [2] , [3];  Zheng, QW (Zheng, Qiwen) [1] , [2];  Lu, W (Lu, Wu) [1] , [2];  Cui, JW (Cui, Jiangwei) [1] , [2];  Li, YD (Li, Yudong) [1] , [2]
收藏  |  浏览/下载：18/0  |  提交时间：2022/04/07
Mid-infrared chalcogenide slot waveguide plasmonic resonator sensor embedded with Au nanorods for surface-enhanced infrared absorption spectroscopy 期刊论文
Results in Physics, 2022, 卷号: 42, 页码: 9
作者:  M. Q. Pi;  H. Zhao;  C. G. Li;  Y. T. Min;  Z. H. Peng
收藏  |  浏览/下载：3/0  |  提交时间：2023/06/14
On-chip mid-infrared silicon-on-insulator waveguide methane sensor using two measurement schemes at 3.291 mu m 期刊论文
Frontiers in Chemistry, 2022, 卷号: 10, 页码: 11
作者:  H. Zhao;  C. T. Zheng;  M. Q. Pi;  L. Liang;  F. Song
收藏  |  浏览/下载：2/0  |  提交时间：2023/06/14
A Compact Optical MEMS Pressure Sensor Based on FabryPerot Interference 期刊论文
Sensors, 2022, 卷号: 22, 期号: 5
作者:  Y. Qi;  M. Zhao;  B. Li;  Z. Ren;  B. Li and X. Wei
收藏  |  浏览/下载：0/0  |  提交时间：2023/06/14
Impacts of carbon ions on SEU in SOI SRAM 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 6
作者:  Gao, J.;  Zhang, Q.;  Xi, K.;  Li, B.;  Wang, C.
收藏  |  浏览/下载：25/0  |  提交时间：2022/01/24
SEE  SEU  SOI SRAM  C  
Ultra-broadband Bragg concave diffraction grating designs on 220-nm SOI for wavelength demultiplexing 期刊论文
Optics Express, 2021, 卷号: 29, 期号: 19, 页码: 30259-30271
作者:  Li, Ke;  Zhu, Jingping;  Duan, Qihang;  Sun, Yuzhou;  Hou, Xun
收藏  |  浏览/下载：15/0  |  提交时间：2021/09/18
Experimental investigation on total-ionizing-dose radiation effects on the electrical properties of SOI-LIGBT 期刊论文
SOLID-STATE ELECTRONICS, 2021, 卷号: 175, 期号: 1, 页码: 1-7
作者:  Yang, GG (Yang, Guangan)[ 1 ];  Wu, WR (Wu, Wangran)[ 1 ];  Zhang, XY (Zhang, Xingyao)[ 2 ];  Tang, PY (Tang, Pengyu)[ 1 ];  Yang, J (Yang, Jing)[ 1 ]
收藏  |  浏览/下载：29/0  |  提交时间：2021/03/15
Impact of TID on Within-Wafer Variability of Radiation-Hardened SOI Wafers 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 7, 页码: 1423-1429
作者:  Zheng, QW (Zheng, Qiwen) 1;  Cui, JW (Cui, Jiangwei) 1;  Yu, XF (Yu, Xuefeng) 1;  Li, YD (Li, Yudong) 1;  Lu, W (Lu, Wu) 1
收藏  |  浏览/下载：37/0  |  提交时间：2021/08/06
Measurement and Evaluation of the Within-Wafer TID Response Variability on BOX Layer of SOI Technology 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 10, 页码: 2516-2523
作者:  Zheng, QW (Zheng, Qiwen) 1Cui, JW (Cui, Jiangwei) 1Yu, XF (Yu, Xuefeng) 1;  Li, YD (Li, Yudong) 1;  Lu, W (Lu, Wu) 1;  He, CF (He, Chengfa) 1;  Guo, Q (Guo, Qi) 1
收藏  |  浏览/下载：38/0  |  提交时间：2021/12/06

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