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科研机构
安徽大学 [4]
北京航空航天大学 [3]
近代物理研究所 [3]
湖南大学 [2]
内容类型
期刊论文 [11]
会议论文 [1]
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2021 [1]
2019 [5]
2018 [4]
2017 [1]
2016 [1]
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Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies
期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:
He, Ze
;
Zhao, Shi-Wei
;
Liu, Tian-Qi
;
Cai, Chang
;
Yan, Xiao-Yu
收藏
  |  
浏览/下载:64/0
  |  
提交时间:2022/01/12
Double interlocked storage cell (DICE)
Error detection and correction (EDAC) code
Heavy ion
Radiation hardening technology
Single event upset (SEU)
Static random-access memory (SRAM)
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Fang, Xiangsheng
;
Zhang, Jiliang
;
Cui, Jie
;
Huang, Zhengfeng
;
Yang, Kang
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2019/04/24
Circuit
reliability
radiation
hardening
soft
error
double-node
upset
single
node
upset
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE Transactions on Circuits and Systems II: Express Briefs, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Aibin Yan
;
Kang Yang
;
Zhengfeng Huang
;
Jiliang Zhang
;
Jie Cui
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2019/12/13
Latches
Radiation hardening (electronics)
Clocks
Feedback loop
Power dissipation
Reliability
Electronic mail
Circuit reliability
radiation hardening
soft error
double-node upset
single node upset
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Yan, AB
;
Yang, K
;
Huang, ZF
;
Zhang, JL
;
Cui, J
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2019/12/17
Circuit reliability
radiation hardening
soft error
double-node upset
single node upset
Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 页码: 1853-1862
作者:
Wang, Bi
;
Wang, Zhaohao
;
Wu, Bi
;
Bai, Yumeng
;
Cao, Kaihua
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2019/12/30
SOT-MRAM
radiation hardening techniques
single event upset
double-node upset
particle
reliability
Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory
会议论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019-05-01
作者:
Wang, Bi
;
Wang, Zhaohao
;
Wu, Bi
;
Bai, Yumeng
;
Cao, Kaihua
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2019/12/30
SOT-MRAM
radiation hardening techniques
single event upset
double-node upset
particle
reliability
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE Transactions on Circuits and Systems II: Express Briefs, 2018, 页码: 1
作者:
Jie Cui
;
Xiangsheng Fang
;
Jiliang Zhang
;
Maoxiang Yi
;
Zhengfeng Huang
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/04/22
Latches
Radiation
hardening
Clocks
Feedback
loop
Power
dissipation
Reliability
Electronic
mail
Circuit
reliability
radiation
hardening
soft
error
double-node
upset
single
node
upset.
Heavy Ion Radiation Effects on a 130-nm COTS NVSRAM under Different Measurement Conditions
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 5, 页码: 1119-1126
作者:
Liu, TQ
;
Liu, J
;
Xi, K
;
Zhang, ZG
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/08/04
Radiation-Hardening Techniques for Spin Orbit Torque-MRAM Peripheral Circuitry
期刊论文
IEEE TRANSACTIONS ON MAGNETICS, 2018, 卷号: 54
作者:
Wang, Bi
;
Wang, Zhaohao
;
Hu, Chunyan
;
Zhao, Yuanfu
;
Zhang, Youguang
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/12/30
Double-node upset (DNU)
peripheral circuitry
radiation hardening by design
single-event upset (SEU)
spin orbit torque magnetic random access memory (SOT-MRAM)
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