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浏览/检索结果: 共13条，第1-10条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文 NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13 作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu 收藏  |  浏览/下载：64/0  |  提交时间：2022/01/12 Double interlocked storage cell (DICE)  Error detection and correction (EDAC) code  Heavy ion  Radiation hardening technology  Single event upset (SEU)  Static random-access memory (SRAM)   A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291 作者:  Fang, Xiangsheng;  Zhang, Jiliang;  Cui, Jie;  Huang, Zhengfeng;  Yang, Kang 收藏  |  浏览/下载：40/0  |  提交时间：2019/04/24 Circuit  reliability  radiation  hardening  soft  error  double-node  upset  single  node  upset   A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文 IEEE Transactions on Circuits and Systems II: Express Briefs, 2019, 卷号: Vol.66 No.2, 页码: 287-291 作者:  Aibin Yan;  Kang Yang;  Zhengfeng Huang;  Jiliang Zhang;  Jie Cui 收藏  |  浏览/下载：25/0  |  提交时间：2019/12/13 Latches  Radiation hardening (electronics)  Clocks  Feedback loop  Power dissipation  Reliability  Electronic mail  Circuit reliability  radiation hardening  soft error  double-node upset  single node upset   A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291 作者:  Yan, AB;  Yang, K;  Huang, ZF;  Zhang, JL;  Cui, J 收藏  |  浏览/下载：16/0  |  提交时间：2019/12/17 Circuit reliability  radiation hardening  soft error  double-node upset  single node upset   Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 页码: 1853-1862 作者:  Wang, Bi;  Wang, Zhaohao;  Wu, Bi;  Bai, Yumeng;  Cao, Kaihua 收藏  |  浏览/下载：21/0  |  提交时间：2019/12/30 SOT-MRAM  radiation hardening techniques  single event upset  double-node upset  particle  reliability   Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory 会议论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019-05-01 作者:  Wang, Bi;  Wang, Zhaohao;  Wu, Bi;  Bai, Yumeng;  Cao, Kaihua 收藏  |  浏览/下载：18/0  |  提交时间：2019/12/30 SOT-MRAM  radiation hardening techniques  single event upset  double-node upset  particle  reliability   A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文 IEEE Transactions on Circuits and Systems II: Express Briefs, 2018, 页码: 1 作者:  Jie Cui;  Xiangsheng Fang;  Jiliang Zhang;  Maoxiang Yi;  Zhengfeng Huang 收藏  |  浏览/下载：13/0  |  提交时间：2019/04/22 Latches  Radiation  hardening  Clocks  Feedback  loop  Power  dissipation  Reliability  Electronic  mail  Circuit  reliability  radiation  hardening  soft  error  double-node  upset  single  node  upset.   A novel double-node-upset-resilient radiation-hardened latch 期刊论文 Journal of Southeast University (English Edition), 2018, 卷号: Vol.34 No.2, 页码: 182-186 作者:  Wang, Qijun;  Yan, Aibin 收藏  |  浏览/下载：3/0  |  提交时间：2019/04/24 Radiation-Hardening Techniques for Spin Orbit Torque-MRAM Peripheral Circuitry 期刊论文 IEEE TRANSACTIONS ON MAGNETICS, 2018, 卷号: 54 作者:  Wang, Bi;  Wang, Zhaohao;  Hu, Chunyan;  Zhao, Yuanfu;  Zhang, Youguang 收藏  |  浏览/下载：11/0  |  提交时间：2019/12/30 Double-node upset (DNU)  peripheral circuitry  radiation hardening by design  single-event upset (SEU)  spin orbit torque magnetic random access memory (SOT-MRAM)   Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology 期刊论文 IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017, 卷号: Vol.25 No.6, 页码: 1978-1982 作者:  Liang,Huaguo;  Xu,Xiumin;  Yi,Maoxiang;  Yan,Aibin;  Ouyang,Yiming 收藏  |  浏览/下载：3/0  |  提交时间：2019/04/22 HIGH-PERFORMANCE  TOLERANT LATCH  SEU  COST