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	A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
	Aibin Yan; Kang Yang; Zhengfeng Huang; Jiliang Zhang; Jie Cui; Xiangsheng Fang; Maoxiang Yi; Xiaoqing Wen
刊名	IEEE Transactions on Circuits and Systems II: Express Briefs
	2019
卷号	Vol.66 No.2页码:287-291
关键词	Latches Radiation hardening (electronics) Clocks Feedback loop Power dissipation Reliability Electronic mail Circuit reliability radiation hardening soft error double-node upset single node upset
ISSN号	1549-7747;1558-3791
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4610384
专题	湖南大学
作者单位	1.School of Computer Science and Technology, Anhui University, Hefei, China 2.School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, China 3.College of Computer Science and Electronic Engineering, Hunan University, Changsha, China 4.Department of Creative Informatics, Kyushu Institute of Technology, Fukuoka, Japan
推荐引用方式 GB/T 7714	Aibin Yan,Kang Yang,Zhengfeng Huang,et al. A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application[J]. IEEE Transactions on Circuits and Systems II: Express Briefs,2019,Vol.66 No.2:287-291.
APA	Aibin Yan.,Kang Yang.,Zhengfeng Huang.,Jiliang Zhang.,Jie Cui.,...&Xiaoqing Wen.(2019).A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application.IEEE Transactions on Circuits and Systems II: Express Briefs,Vol.66 No.2,287-291.
MLA	Aibin Yan,et al."A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application".IEEE Transactions on Circuits and Systems II: Express Briefs Vol.66 No.2(2019):287-291.

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