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	A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
	Yan, AB; Yang, K; Huang, ZF; Zhang, JL; Cui, J; Fang, XS; Yi, MX; Wen, XQ
刊名	IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
	2019
卷号	Vol.66 No.2页码:287-291
关键词	Circuit reliability radiation hardening soft error double-node upset single node upset
ISSN号	1549-7747
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4738825
专题	湖南大学
作者单位	1.Anhui Univ, Sch Comp Sci & Technol, Hefei 230601, Anhui, Peoples R China 2.Hefei Univ Technol, Sch Elect Sci & Appl Phys, Hefei 230009, Anhui, Peoples R China 3.Hunan Univ, Coll Comp Sci & Elect Engn, Changsha 410082, Hunan, Peoples R China 4.Kyushu Inst Technol, Dept Creat Informat, Fukuoka, Fukuoka 8208502, Japan 5.Kyushu Inst Technol, Grad Sch Comp Sci & Syst Engn, Fukuoka, Fukuoka 8208502, Japan
推荐引用方式 GB/T 7714	Yan, AB,Yang, K,Huang, ZF,et al. A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS,2019,Vol.66 No.2:287-291.
APA	Yan, AB.,Yang, K.,Huang, ZF.,Zhang, JL.,Cui, J.,...&Wen, XQ.(2019).A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS,Vol.66 No.2,287-291.
MLA	Yan, AB,et al."A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application".IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS Vol.66 No.2(2019):287-291.

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