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期刊论文 [15]
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Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts
期刊论文
ELECTRONICS, 2021, 卷号: 10, 期号: 23, 页码: 11
作者:
Sun, Yi
;
Li, Zhi
;
He, Ze
;
Chi, Yaqing
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2022/04/11
D flip-flop
double interlocked storage cell
single event upset
Multiple Layout-Hardening Comparison of SEU-Mitigated Filp-Flops in 22-nm UTBB FD-SOI Technology
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 1, 页码: 374-381
作者:
Cai, Chang
;
Liu, Tianqi
;
Zhao, Peixiong
;
Fan, Xue
;
Huang, Hongyang
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2022/01/19
D filp-flops (DFFs)
heavy ions
radiation hardening
single-event upsets (SEUs)
ultrathin body and buried oxide fully depleted silicon on insulator (UTBB FDSOI)
Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs
期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 3, 页码: 13
作者:
Ke, Lingyun
;
Zhao, Peixiong
;
Liu, Jie
;
Fan, Xue
;
Cai, Chang
收藏
  |  
浏览/下载:108/0
  |  
提交时间:2019/11/10
FPGA
radiation hardening
single event upsets
heavy ions
error rates
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application
期刊论文
IEEE Transactions on Circuits and Systems II: Express Briefs, 2019, 卷号: Vol.66 No.2, 页码: 287-291
作者:
Aibin Yan
;
Kang Yang
;
Zhengfeng Huang
;
Jiliang Zhang
;
Jie Cui
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2019/12/13
Latches
Radiation hardening (electronics)
Clocks
Feedback loop
Power dissipation
Reliability
Electronic mail
Circuit reliability
radiation hardening
soft error
double-node upset
single node upset
LOCld65, a Dual-Channel VCSEL Driver ASIC for Detector Front-End Readout
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 7, 页码: 1115-1122
作者:
Zhou, Wei
;
Gong, Datao
;
Sun, Quan
;
Guo, Di
;
Huang, Guangming
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  |  
浏览/下载:44/0
  |  
提交时间:2019/12/23
Analog integrated circuits
application-specific integrated circuits
high energy physics instrumentation computing
Large Hadron Collider (LHC)
optical transmitters
radiation hardening (electronics)
A radiation-hardening Ta/Ta2O5-x/Al2O3/InGaZnO4 memristor for harsh electronics
期刊论文
APPLIED PHYSICS LETTERS, 2018, 卷号: 113
作者:
Wang, Jingjuan
;
Ren, Deliang
;
Zhang, Zichang
;
Xiang, Hongwen
;
Zhao, Jianhui
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  |  
浏览/下载:17/0
  |  
提交时间:2019/11/26
Single-event transient characterization of a radiation-tolerant charge-pump phase-locked loop fabricated in 130 nm pd-soi technology
期刊论文
Ieee transactions on nuclear science, 2016, 卷号: 63, 期号: 4, 页码: 2402-2408
作者:
Chen, Zhuojun
;
Lin, Min
;
Zheng, Yunlong
;
Wei, Zuodong
;
Huang, Shuigen
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  |  
浏览/下载:42/0
  |  
提交时间:2019/05/09
Heavy-ion testing
Pd-soi
Phase-locked loop
Pulsed-laser testing
Radiation hardening by design
Single-event transients
Collection of charge in NMOS from single event effect
期刊论文
IEICE ELECTRONICS EXPRESS, 2016, 卷号: 13, 期号: 8, 页码: 1-8
作者:
Wang, Jingqiu
;
Lin, Fujiang
;
Wang, Donglin
;
Song, Wenna
;
Liu, Li
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2016/09/30
Single Event Effect
Ultra Deep Sub-micron
Double Exponential Transient Current Model
Multi-dimensional
Component prototypes towards a low-latency, small-form-factor optical link for the ATLAS Liquid Argon Calorimeter Phase-I trigger upgrade
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 卷号: 62, 期号: 1, 页码: 250-256
作者:
Deng
;
Binwei
;
He
;
Mengxun
;
Chen
收藏
  |  
浏览/下载:36/0
  |  
提交时间:2016/04/18
ATLAS liquid argon calorimeters
High energy physics instrumentations
High-speed integrated circuits
Low overhead
Optical transmitter module
Radiation hardening (electronics)
Small form factors
Transmitter optical subassembly
Component prototypes towards a low-latency, small-form-factor optical link for the ATLAS Liquid Argon Calorimeter Phase-I trigger upgrade
期刊论文
IEEE Transactions on Nuclear Science, 2015, 卷号: 62, 期号: 1, 页码: 250-256
作者:
Deng, Binwei
;
He, Mengxun
;
Chen, Jinghong
;
Gong, Datao
;
Guo, Di
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/17
High energy physics instrumentation computing
high-speed integrated circuits
optical fiber communication
optical transmitters
radiation hardening (electronics)
real-time systems
trigger circuits
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