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CORC

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Direct Fluorination Induced Variation in Interface Discharge Behavior Between Polypropylene and Silicone Rubber Under AC Voltage 期刊论文
IEEE ACCESS, 2018, 卷号: Vol.6, 页码: 23907-23917
作者:  Gao, Y.a;  Yuan, Y.a;  Chen, L.b;  Li, J.a;  Huang, S.a
收藏  |  浏览/下载：2/0  |  提交时间：2019/11/21
A Biopolymer Heparin Sodium Interlayer Anchoring TiO2 and MAPbI(3) Enhances Trap Passivation and Device Stability in Perovskite Solar Cells 期刊论文
ADVANCED MATERIALS, 2018, 卷号: 30, 页码: e1706924
作者:  You, Shuai;  Wang, Hui;  Bi, Shiqing;  Zhou, Jiyu;  Qin, Liang
收藏  |  浏览/下载：7/0  |  提交时间：2019/12/30
Atomic origin of the traps in memristive interface 期刊论文
Nano Research, 2017, 卷号: 10, 期号: 6, 页码: 1924-1931
作者:  Ye Tian;  Lida Pan;  Chuan Fei Guo;  Qian Liu
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/24
Anomalous electrical properties induced by hot-electron-injection in 130-nm partially depleted soi nmosfets fabricated on modified wafer 期刊论文
Ieee transactions on nuclear science, 2016, 卷号: 63, 期号: 5, 页码: 2731-2737
作者:  Dai, Lihua;  Bi, Dawei;  Ning, Bingxu;  Hu, Zhiyuan;  Song, Lei
收藏  |  浏览/下载：59/0  |  提交时间：2019/05/09
Oxidation precursor dependence of atomic layer deposited al2o3 films in a-si:h(i)/al2o3 surface passivation stacks 期刊论文
Nanoscale research letters, 2015, 卷号: 10, 期号: 1
作者:  Xiang,Yuren;  Zhou,Chunlan;  Jia,Endong;  Wang,Wenjing
收藏  |  浏览/下载：62/0  |  提交时间：2019/05/09
Impact of nitrogen plasma passivation on the interface of germanium MOS capacitor 期刊论文
chinese physics b, 2014
Yun Quan-Xin; Li Ming; An Xia; Lin Meng; Liu Peng-Qiang; Li Zhi-Qiang; Zhang Bing-Xin; Xia Yu-Xuan; Zhang Hao; Zhang Xing; Huang Ru; Wang Yang-Yuan
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10
A Comparative Study on the Impacts of Interface Traps on Tunneling FET and MOSFET 期刊论文
ieee电子器件汇刊, 2014
Qiu, Yingxin; Wang, Runsheng; Huang, Qianqian; Huang, Ru
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/10
TDDB characteristic and breakdown mechanism of ultra-thin SiO_2/HfO_2 bilayer gate dielectrics 期刊论文
Journal of Semiconductors, 2014, 期号: 06, 页码: 36-41
作者:  Tao FF(陶芬芬);  Yang H(杨红);  Tang B(唐波);  Tang ZY(唐兆云);  Xu YF(徐烨锋)
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/17
Unified Reaction-Diffusion Model for Accurate Prediction of Negative Bias Temperature Instability Effect 期刊论文
日本应用物理学杂志, 2012
Ma, Chenyue; Mattausch, Hans Juergen; Miyake, Masataka; Matsuzawa, Kazuya; Iizuka, Takahiro; Yamaguchi, Seiichiro; Hoshida, Teruhiko; Kinoshita, Akinari; Arakawa, Takahiko; He, Jin; Miura-Mattausch, Mitiko
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
A New Model for Two-Dimensional Electrical-Field-Dependent V-th Instability of pMOSFETs With Ultrathin DPN Gate Dielectrics 期刊论文
ieee electron device letters, 2011
Yang, Jiaqi; Yang, Jingfeng; Liu, X. Y.; Han, R. Q.; Kang, J. F.; Gan, Z. H.; Liao, C. C.; Wu, H. M.
收藏  |  浏览/下载：6/0  |  提交时间：2015/11/10

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