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Separating Si phases from diagenetically-modified sediments through sequential leaching
期刊论文
CHEMICAL GEOLOGY, 2023, 卷号: 637, 页码: 12
作者:
Huang, Tzu-Hao
;
Sun, Xiaole
;
Somelar, Peeter
;
Kirsimae, Kalle
;
Pickering, Rebecca A.
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2023/12/07
1/f Noise responses of Ultra-Thin Body and Buried oxide FD-SOI PMOSFETs under total ionizing dose irradiation
期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2022, 卷号: 176, 期号: 11-12, 页码: 1202-1214
作者:
Zhang, RQ (Zhang, Ruiqin) [1] , [2] , [3]
;
Zheng, QW (Zheng, Qiwen) [1] , [2]
;
Lu, W (Lu, Wu) [1] , [2]
;
Cui, JW (Cui, Jiangwei) [1] , [2]
;
Li, YD (Li, Yudong) [1] , [2]
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2022/04/07
Total ionizing dose irradiation
UTBB FD-SOI
1
f noise
Experimental investigation on total-ionizing-dose radiation effects on the electrical properties of SOI-LIGBT
期刊论文
SOLID-STATE ELECTRONICS, 2021, 卷号: 175, 期号: 1, 页码: 1-7
作者:
Yang, GG (Yang, Guangan)[ 1 ]
;
Wu, WR (Wu, Wangran)[ 1 ]
;
Zhang, XY (Zhang, Xingyao)[ 2 ]
;
Tang, PY (Tang, Pengyu)[ 1 ]
;
Yang, J (Yang, Jing)[ 1 ]
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2021/03/15
SOI-LIGBT
Total-ionizing-dose
Radiation
Degradation
Impact of TID on Within-Wafer Variability of Radiation-Hardened SOI Wafers
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 7, 页码: 1423-1429
作者:
Zheng, QW (Zheng, Qiwen) 1
;
Cui, JW (Cui, Jiangwei) 1
;
Yu, XF (Yu, Xuefeng) 1
;
Li, YD (Li, Yudong) 1
;
Lu, W (Lu, Wu) 1
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2021/08/06
Radiation-hardened (RH)silicon-on-insulator (SOI)total ionizing dose (TID)within-wafer variability
Measurement and Evaluation of the Within-Wafer TID Response Variability on BOX Layer of SOI Technology
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 10, 页码: 2516-2523
作者:
Zheng, QW (Zheng, Qiwen) 1Cui, JW (Cui, Jiangwei) 1Yu, XF (Yu, Xuefeng) 1
;
Li, YD (Li, Yudong) 1
;
Lu, W (Lu, Wu) 1
;
He, CF (He, Chengfa) 1
;
Guo, Q (Guo, Qi) 1
收藏
  |  
浏览/下载:39/0
  |  
提交时间:2021/12/06
Threshold voltage
TestingMOSFET circuits
Transistors
Standards
Logic gates
Fluctuations
Buried oxide (BOX)
silicon-on-insulator (SOI)
total ionizing dose (TID)
Self-Recovery of Defective PbTiO3 Film with Enhanced Piezoelectricity by Homogenizing Annealing
期刊论文
CRYSTAL GROWTH & DESIGN, 2020, 卷号: 20, 期号: 9, 页码: 5967-5973
作者:
Cheng, Long
;
Tang, Yunlong
;
Zhu, Yinlian
;
Ma, Xiuliang
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2021/02/02
Self-recovery of defective PbTiO3film with enhanced piezoelectricity by homogenizing annealing
期刊论文
Crystal Growth and Design, 2020, 卷号: 20, 期号: 9, 页码: 5967-5973
作者:
Cheng, Long
;
Tang, Yunlong
;
Zhu, Yinlian
;
Ma, Xiuliang
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2020/11/14
Annealing
Crystallography
Defects
Domain walls
Growth kinetics
High resolution transmission electron microscopy
Lead titanate
Piezoelectricity
Pulsed laser deposition
Scanning electron microscopy
Strontium titanates
Thermodynamics
Thin films
Titanium compounds
Coupling relationships
Growth of thin films
Homogenizing annealing
Impurity defects
Kinetics and thermodynamics
Low oxygen pressure
Non-equilibrium process
Piezoelectric force microscopy
The influence of channel width on total ionizing dose responses of the 130 nm H-gate partially depleted SOI NMOSFETs
期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 551-558
作者:
Xi, SX (Xi, Shan-Xue)[ 1,2,3 ]
;
Zheng, QW (Zheng, Qi-Wen)[ 1,2 ]
;
Lu, W (Lu, Wu)[ 1,2 ]
;
Cui, JW (Cui, Jiang-Wei)[ 1,2 ]
;
Wei, Y (Wei, Ying)[ 1,2 ]
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2020/07/06
Total ionizing dose
h-shape gate
channel width
partially depleted
Multiple Layout-Hardening Comparison of SEU-Mitigated Filp-Flops in 22-nm UTBB FD-SOI Technology
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 1, 页码: 374-381
作者:
Cai, Chang
;
Liu, Tianqi
;
Zhao, Peixiong
;
Fan, Xue
;
Huang, Hongyang
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2022/01/19
D filp-flops (DFFs)
heavy ions
radiation hardening
single-event upsets (SEUs)
ultrathin body and buried oxide fully depleted silicon on insulator (UTBB FDSOI)
The molecular mechanism of robust macrophage immune responses induced by PEGylated molybdenum disulfide
期刊论文
NANOSCALE, 2019, 卷号: 11, 期号: 46, 页码: 22293-22304
作者:
Gu, Zonglin
;
Chen, Serena H.
;
Ding, Zhaowen
;
Song, Wei
;
Wei, Wei
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2020/03/24
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