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近代物理研究所 [11]
山东大学 [6]
自动化研究所 [3]
西安交通大学 [2]
新疆理化技术研究所 [1]
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期刊论文 [20]
会议论文 [6]
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TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images
期刊论文
INTEGRATION-THE VLSI JOURNAL, 2024, 卷号: 95, 页码: 9
作者:
Xiao, Wei
;
Zhao, Fazhan
;
Zhao, Kun
;
Ma, Hongtu
;
Li, Qing
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2024/02/20
Scanning electron microscopy
Deep learning
Hardware trust and assurance
Integrated circuit
Powerful-IoU: More straightforward and faster bounding box regression loss with a nonmonotonic focusing mechanism
期刊论文
NEURAL NETWORKS, 2024, 卷号: 170, 页码: 276-284
作者:
Liu, Can
;
Wang, Kaige
;
Li, Qing
;
Zhao, Fazhan
;
Zhao, Kun
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2024/02/22
Object detection
Bounding box regression
Loss function design
Focusing mechanism
Novel methods for locating and matching IC cells based on standard cell libraries
期刊论文
MICROELECTRONIC ENGINEERING, 2024, 卷号: 283, 页码: 12
作者:
Liu, Can
;
Wang, Kaige
;
Li, Qing
;
Zhao, Fazhan
;
Zhao, Kun
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2024/02/22
Reverse engineering
Integrated circuits
Scanning electron microscopy
Image processing
Hardware security
Engineering and Microscopic Mechanism of Quantum Emitters Induced by Heavy Ions in hBN
期刊论文
ACS PHOTONICS, 2021, 卷号: 8, 期号: 10, 页码: 2912-2922
作者:
Gu, Rui
;
Wang, Lei
;
Zhu, Huiping
;
Han, Shuangping
;
Bai, Yurong
收藏
  |  
浏览/下载:32/0
  |  
提交时间:2021/12/13
heavy ion irradiation
hBN
quantum emitters
PL mapping
production efficiency
point defects
Radiation effects of heavy ions on the static and dynamic characteristics of 850 nm high-speed vertical cavity surface emitting lasers
期刊论文
JOURNAL OF LUMINESCENCE, 2021, 卷号: 237, 页码: 7
作者:
Shan, Xiaoting
;
Li, Bo
;
Zhao, Fazhan
;
Wang, Lei
;
Sun, Yun
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  |  
浏览/下载:26/0
  |  
提交时间:2021/12/09
VCSEL
Radiation effects
Dynamic characteristics
Quantum wells
The prevalence and related factors of metabolic syndrome in outpatients with first-episode drug-naive major depression comorbid with anxiety
期刊论文
SCIENTIFIC REPORTS, 2021, 卷号: 11, 期号: 1, 页码: 9
作者:
Zhong, Yinghua
;
Hu, Manji
;
Wang, Qiang
;
Yang, Zhendong
;
Zhu, Na
收藏
  |  
浏览/下载:55/0
  |  
提交时间:2021/03/29
Comparison of X-Ray and Proton Irradiation Effects on the Characteristics of InGaN/GaN Multiple Quantum Wells Light-Emitting Diodes
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 7, 页码: 1345-1350
作者:
Lei Wang
;
Ningyang Liu
;
Bo Li
;
Huiping Zhu
;
Xiaoting Shan
;
Qingxi Yuan
;
Xuewen Zhang
;
Zheng Gong
;
Fazhan Zhao
;
Naixin Liu
;
Mengxin Liu
;
Binhong Li
;
Jiantou Gao
;
Yang Huang
;
Jianqun Yang
;
Xingji Li
;
Jiajun Luo
;
Zhengsheng Han, and Xinyu
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  |  
浏览/下载:22/0
  |  
提交时间:2021/06/28
The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018
作者:
Song Gu
;
Jie Liu
;
Jinshun Bi
;
Fazhan Zhao
;
zhangang Zhang
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/04/12
The Impacts of Heavy Ion Energy on Single Event Upsets in SOI SRAMs
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 1091-1100
作者:
Gu, Song
;
Liu, Jie
;
Bi, Jinshun
;
Zhao, Fazhan
;
Zhang, Zhangang
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2018/07/16
Energy dependence
heavy ions
nuclear reactions
silicon-on-insulator (SOI) technology
single event upset (SEU)
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM
会议论文
作者:
Yan, Weiwei
;
Wang, Bin
;
Zeng, Chuanbin
;
Geng, Chao
;
Liu, Tianqi
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2018/08/20
Heavy ion irradiation
Single event upset
Active delay element
SRAM cell
Radiation hardened
Silicon-on-insulator
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