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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2019     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291 作者:  Fang, Xiangsheng;  Zhang, Jiliang;  Cui, Jie;  Huang, Zhengfeng;  Yang, Kang 收藏  |  浏览/下载：40/0  |  提交时间：2019/04/24 Circuit  reliability  radiation  hardening  soft  error  double-node  upset  single  node  upset   A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文 IEEE Transactions on Circuits and Systems II: Express Briefs, 2019, 卷号: Vol.66 No.2, 页码: 287-291 作者:  Aibin Yan;  Kang Yang;  Zhengfeng Huang;  Jiliang Zhang;  Jie Cui 收藏  |  浏览/下载：25/0  |  提交时间：2019/12/13 Latches  Radiation hardening (electronics)  Clocks  Feedback loop  Power dissipation  Reliability  Electronic mail  Circuit reliability  radiation hardening  soft error  double-node upset  single node upset   A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2019, 卷号: Vol.66 No.2, 页码: 287-291 作者:  Yan, AB;  Yang, K;  Huang, ZF;  Zhang, JL;  Cui, J 收藏  |  浏览/下载：16/0  |  提交时间：2019/12/17 Circuit reliability  radiation hardening  soft error  double-node upset  single node upset   Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 页码: 1853-1862 作者:  Wang, Bi;  Wang, Zhaohao;  Wu, Bi;  Bai, Yumeng;  Cao, Kaihua 收藏  |  浏览/下载：21/0  |  提交时间：2019/12/30 SOT-MRAM  radiation hardening techniques  single event upset  double-node upset  particle  reliability   Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory 会议论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019-05-01 作者:  Wang, Bi;  Wang, Zhaohao;  Wu, Bi;  Bai, Yumeng;  Cao, Kaihua 收藏  |  浏览/下载：18/0  |  提交时间：2019/12/30 SOT-MRAM  radiation hardening techniques  single event upset  double-node upset  particle  reliability