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| The effect of thermal treatment induced performance improvement for Charge Trapping Memory with Al2O3/(HfO2)0.9(Al2O3)0.1/Al2O3 Multilayer Structure 期刊论文
ECS Journal of Solid State Science and Technology, 2018
作者: Hou CZ(侯朝昭); Wu ZH(吴振华) ; Yin HX(殷华湘)
  收藏 | 浏览/下载：54/0 | 提交时间：2019/05/05 |
| Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment 期刊论文
Microelectronics Reliability, 2018
作者: Zhang QZ(张青竹); Yin HX(殷华湘); Han ZS(韩郑生); Luo JJ(罗家俊); Li B(李博)
收藏 | 浏览/下载：20/0 | 提交时间：2019/03/27 |
| Process variation dependence of total ionizing dose effects in bulk nFinFETs 期刊论文
Microelectronics Reliability, 2018
作者: Zheng ZS(郑中山); Huang YB(黄云波); Li B(李博); Luo JJ(罗家俊); Han ZS(韩郑生)
收藏 | 浏览/下载：24/0 | 提交时间：2019/03/28 |
| Comparative Investigation of Flat-Band Voltage Modulation by Nitrogen Plasma Treatment for Advanced HKMG Technology 期刊论文
ECS Journal of Solid State Science and Technology, 2018
作者: Zhang QZ(张青竹); Yao JX(姚佳欣); Yin HX(殷华湘); Wu ZH(吴振华); Gao JF(高建峰)
收藏 | 浏览/下载：51/0 | 提交时间：2019/05/05 |
| Performance Enhancement for Charge Trapping Memory by Using Al2O3/HfO2/Al2O3 Tri-Layer High-k Dielectrics and High Work Function Metal Gate 期刊论文
ECS Journal of Solid State Science and Technology, 2018
作者: Hou CZ(侯朝昭); Wu ZH(吴振华); Yin HX(殷华湘)
收藏 | 浏览/下载：23/0 | 提交时间：2019/05/05 |
| Physical Insights on Quantum Confinement and Carrier Mobility in Si, Si0.45Ge0.55, Ge Gate-All-Around NSFET for 5 nm Technology Node 期刊论文
Journal of the Electron Devices Society, 2018
作者: Gu J(顾杰); Wen Yang; Wu ZH(吴振华); Yin HX(殷华湘); Wang WW(王文武)
收藏 | 浏览/下载：30/0 | 提交时间：2019/05/05 |
| Total Ionizing Dose Response and Annealing Behavior of Bulk nFinFETs With ON-State Bias Irradiation 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018
作者: Yang L(杨玲); Zhang QZ(张青竹); Huang YB(黄云波); Zheng ZS(郑中山); Li B(李博)
收藏 | 浏览/下载：17/0 | 提交时间：2019/03/28 |
| Investigation for the Feasibility of High-Mobility Channel in 3D NAND Memory 期刊论文
ECS Journal of Solid State Science and Technology, 2018
作者: Hou CZ(侯朝昭); Yin HX(殷华湘); Wu ZH(吴振华); Yao JX(姚佳欣)
收藏 | 浏览/下载：35/0 | 提交时间：2019/05/05 |
| Novel GAA Si Nanowire p-MOSFETs With Excellent Short-Channel Effect Immunity via an Advanced Forming Process 期刊论文
IEEE Electron Device Letters, 2018
作者: Zhang QZ(张青竹); Yin HX(殷华湘); Meng LK(孟令款); Yao JX(姚佳欣); Li JJ(李俊杰)
收藏 | 浏览/下载：27/0 | 提交时间：2019/05/05 |
| Complementary Metal Oxide Semiconductor 专著
:IntechOpen, 2018
作者: Yin HX(殷华湘); Wang GL(王桂磊); Yao JX(姚佳欣); Henry Homayoun Radamson
收藏 | 浏览/下载：23/0 | 提交时间：2019/05/23 |
