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Mobility Degradation by Remote Coulomb Scattering and Distribution of Charge and Dipole in Al2O3/GeOx Gate Stacks of Ge Based MOSFET 会议论文
作者:  Xiang JJ(项金娟);  Zhou LX(周丽星);  Wang XL(王晓磊);  Zhao C(赵超);  Ye TC(叶甜春)
收藏  |  浏览/下载:14/0  |  提交时间:2018/07/26
Effects of Annealing Ambient on Interface Charge and Dipole in GeOx/Al2O3 Gate Stacks of Ge Based MOSCAP 会议论文
作者:  Wang XL(王晓磊);  Xiang JJ(项金娟);  Zhao C(赵超);  Wang WW(王文武);  Ye TC(叶甜春)
收藏  |  浏览/下载:13/0  |  提交时间:2018/07/26
Improvement of Device Reliability by Introducing a BEOL-Compatible TiN Barrier Layer in CBRAM 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
作者:  Cao RR(曹荣荣);  Liu M(刘明);  Long SB(龙世兵);  Lv HB(吕杭炳);  Wang Y(王艳)
收藏  |  浏览/下载:21/0  |  提交时间:2018/07/12
Emulating Short-Term and Long-Term Plasticity of Bio-Synapse Based on Cu,a-Si,Pt Memristor 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
作者:  Wu FC(伍法才);  Zhang XM(张续猛);  Liu S(刘森);  Liu M(刘明);  Wu QT(吴全潭)
收藏  |  浏览/下载:25/0  |  提交时间:2018/07/12
Angle-resolved x-ray photoelectron spectroscopy study of GeO growth by plasma post-oxidation 期刊论文
Chinese Physics B, 2017
作者:  Zhao C(赵超);  Wang XL(王晓磊);  Wang WW(王文武);  Zhao ZQ(赵治乾)
收藏  |  浏览/下载:6/0  |  提交时间:2018/07/09
Study of sigma-shaped source/drain recesses for embedded-SiGe pMOSFETs 期刊论文
Microelectronic Engineering, 2017
作者:  Zhu HL(朱慧珑);  Xu QX(徐秋霞);  Li JF(李俊峰);  Zhao C(赵超);  Henry Homayoun Radamson
收藏  |  浏览/下载:47/0  |  提交时间:2018/07/09
Experimental Investigation on Growth Mechanism of GeOx Layer Formed by Plasma Post Oxidation Based on Angle Resolved X-ray Photoelectron Spectroscopy 会议论文
作者:  Wang XL(王晓磊);  Ye TC(叶甜春);  Wang WW(王文武);  Zhao ZQ(赵治乾);  Zhao C(赵超)
收藏  |  浏览/下载:8/0  |  提交时间:2018/07/26
Hole mobility degradation by remote Coulomb scattering and charge distribution in Al2O3/GeOx gate stacks in bulk Ge pMOSFET with GeOx grown by ozone oxidation 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2017
作者:  Ye TC(叶甜春);  Zhou LX(周丽星);  Wang XL(王晓磊);  Ma XL(马雪丽);  Xiang JJ(项金娟)
收藏  |  浏览/下载:7/0  |  提交时间:2018/07/09
Physically Based Evaluation of Effect of Buried Oxide on Surface Roughness Scattering Limited Hole Mobility in Ultrathin GeOI MOSFET 期刊论文
IEEE Transactrions on Elelctron Diveces, 2017
作者:  Wang SK(王盛凯);  Han K(韩楷);  Wang WW(王文武);  Ye TC(叶甜春);  Zhao C(赵超)
收藏  |  浏览/下载:15/0  |  提交时间:2018/07/09
Crystallization behaviors of ultrathin Al-doped HfO2 amorphous films grown by atomic layer deposition 期刊论文
Chin. Phys. B, 2017
作者:  Wang XL(王晓磊);  Xiang JJ(项金娟);  Yang H(杨红);  Ma XL(马雪丽);  Zhu HL(朱慧珑)
收藏  |  浏览/下载:5/0  |  提交时间:2018/06/08


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