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期刊论文 [27]
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Beam optics of upgraded high energy heavy ion microbeam in Lanzhou
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 461, 页码: 10-15
作者:
Ponomarov, Artem
;
Du, Guanghua
;
Guo, Jinlong
;
Liu, Wenjing
;
Wu, Ruqun
收藏
  |  
浏览/下载:38/0
  |  
提交时间:2022/01/19
High energy heavy ion microbeam
Spatial resolution
Beam optics simulation
Cyclotron
Carbon therapy
Single event upset
Preliminary single event effect distribution investigation on 28 nm soc using heavy ion microbeam
期刊论文
Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2019, 卷号: 450, 页码: 323-326
作者:
Yang, Weitao
;
Du, Xuecheng
;
Guo, Jinlong
;
Wei, Junze
;
Du, Guanghua
收藏
  |  
浏览/下载:113/0
  |  
提交时间:2019/10/08
Single event effect (see)
System on chip (soc)
Heavy ion microbeam
On-chip-memory (ocm)
Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 450, 页码: 323-326
作者:
Yang, Weitao
;
Du, Xuecheng
;
Guo, Jinlong
;
Wei, Junze
;
Du, Guanghua
收藏
  |  
浏览/下载:72/0
  |  
提交时间:2019/11/10
Single event effect (SEE)
System on Chip (SoC)
Heavy ion microbeam
On-chip-memory (OCM)
Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam
期刊论文
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2018
作者:
Yang, Weitao
;
Du, Xuecheng
;
Guo, Jinlong
;
Wei, Junze
;
Du, Guanghua
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2019/11/19
All Programmable SoC
Heavy ion microbeam
Layout information
Modern physics
On chip memory
Partial cross section
Single event effects
System on chips (SoC)
Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 页码: 545-549
作者:
Yang, Weitao
;
Du, Xuecheng
;
He, Chaohui
;
Shi, Shuting
;
Cai, Li
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/11/26
microbeam
single-event effect (SEE)
processing system (PS)
Heavy ion
system on chip (SoC)
The rectification of mono- and bivalent ions in single conical nanopores
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 219-223
作者:
Ponomarov, Artem
;
Chen, Hao
;
Wei, Junzhe
;
Du, Guanghua
;
Guo, Jinlong
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2018/05/31
Single conical nanopores
Rectification
Mono- and bivalent ions
Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258
作者:
Wang, Bin
;
Liu, Tianqi
;
Liu, Jie
;
Yang, Zhenlei
;
Guo, Jinlong
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2018/05/31
Heavy-ion microbeam
High-energy
Single event upset
FPGA
Imaging
Influence of the environment and phototoxicity of the live cell imaging system at IMP microbeam facility
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 125-130
作者:
Wu, Ruqun
;
Guo, Jinlong
;
Du, Guanghua
;
Liu, Wenjing
;
Zhao, Jing
收藏
  |  
浏览/下载:30/0
  |  
提交时间:2018/05/31
Live cell imaging
DNA damage and repair
Phototoxicity
Environment control
Microbeam
Influence of the environment and phototoxicity of the live cell imaging system at IMP microbeam facility
会议论文
作者:
Liu, Wenjing
;
Wei, Junzhe
;
Wu, Ruqun
;
Guo, Jinlong
;
Du, Guanghua
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2018/08/20
Live cell imaging
DNA damage and repair
Phototoxicity
Environment control
Microbeam
Influence of the environment and phototoxicity of the live cell imaging system at IMP microbeam facility
会议论文
作者:
Du, Guanghua
;
Liu, Wenjing
;
Wu, Ruqun
;
Wei, Junzhe
;
Chen, Hao
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2018/08/20
Live cell imaging
DNA damage and repair
Phototoxicity
Environment control
Microbeam
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