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	Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam
	Yang, Weitao; Du, Xuecheng; Guo, Jinlong; Wei, Junze; Du, Guanghua; He, Chaohui; Liu, Wenjing; Shen, Shuaishuai; Huang, Chengliang; Li, Yonghong
刊名	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
	2018
关键词	All Programmable SoC Heavy ion microbeam Layout information Modern physics On chip memory Partial cross section Single event effects System on chips (SoC)
ISSN号	0168-583X
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2830544
专题	西安交通大学
推荐引用方式 GB/T 7714	Yang, Weitao,Du, Xuecheng,Guo, Jinlong,et al. Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam[J]. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms,2018.
APA	Yang, Weitao.,Du, Xuecheng.,Guo, Jinlong.,Wei, Junze.,Du, Guanghua.,...&Fan, Yunyun.(2018).Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam.Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms.
MLA	Yang, Weitao,et al."Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam".Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms (2018).

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