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Analytical Surface Potential-Based Compact Model for Independent Dual Gate a-IGZO TFT
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 卷号: 68, 期号: 4, 页码: 2049-2055
作者:
Guo, Jingrui
;
Zhao, Ying
;
Yang, Guanhua
;
Chuai, Xichen
;
Lu, Wenhao
收藏
  |  
浏览/下载:85/0
  |  
提交时间:2021/06/01
Electric potential
Solid modeling
Logic gates
Integrated circuit modeling
Numerical models
Thin film transistors
Analytical models
Analytical models
independent dual gate (IDG) amorphous In-Ga-Zn-O thin-film transistors (IDG a-IGZO TFTs)
Schroder method
surface potential
threshold compensation effect
Fully Printed Top-Gate Metal-Oxide Thin-Film Transistors Based on Scandium-Zirconium-Oxide Dielectric
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 卷号: 66, 页码: 445-450
作者:
Li, Yuzhi[1]
;
Lan, Linfeng[2]
;
Hu, Shiben[3]
;
Gao, Peixiong[4]
;
Dai, Xingqiang[5]
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2019/04/22
Inkjet printing
scandium zirconium oxide (Sc1Zr1Ox)
thin-film transistors (TFTs)
top gate
Enhanced Stability in Zr-Doped ZnO TFTs With Minor Influence on Mobility by Atomic Layer Deposition
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 卷号: 66, 页码: 1760-1765
作者:
Yang, Jun[1]
;
Zhang, Yongpeng[2]
;
Qin, Cunping[3]
;
Ding, Xingwei[4]
;
Zhang, Jianhua[5]
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/04/22
Atomic layer deposition (ALD)
oxygen defects
temperature stability
Zr-doped ZnO (ZrZnO) thin-film transistors (TFTs)
Effects of yttrium doping on the electrical performances and stability of ZnO thin-film transistors
期刊论文
APPLIED SURFACE SCIENCE, 2019, 卷号: 475
作者:
Abliz, Ablat
;
Xu, Lei
;
Wan, Da
;
Duan, Haiming
;
Wang, Jingli
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  |  
浏览/下载:2/0
  |  
提交时间:2019/12/05
Zinc oxide (ZnO)
Thin film transistors (TFTs)
Bias stress stability
Doping
Low-Voltage, Flexible InGaZnO Thin-Film Transistors Gated With Solution-Processed, Ultra-Thin AlxOy
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2019, 卷号: 40, 期号: 1, 页码: 36-39
作者:
Cai, Wensi
;
Wilson, Joshua
;
Zhang, Jiawei
;
Park, Seonghyun
;
Majewski, Leszek
收藏
  |  
浏览/下载:46/0
  |  
提交时间:2019/12/11
Indium-gallium-zinc-oxide
thin-film transistors (TFTs)
plastic
substrate
1 V operation
Polymer-Doped Ink System for Threshold Voltage Modulation in Printed Metal Oxide Thin Film Transistors
期刊论文
JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2019, 卷号: 10, 页码: 3415-3419
作者:
Zhu, Zhennan
;
Zhang, Jianhua
;
Wang, Yiping
;
Ning, Honglong
;
Guo, Dong
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2019/12/30
Indium compounds
Metals
Polymers
Semiconductor doping
Thin film circuits
Thin films
Threshold voltage
Effect of doping
Electrical performance
Enhancement-mode devices
Metal oxide thin-film transistors
Polymer doping
Subthreshold slope
Thin-film transistor (TFTs)
Threshold voltage modulations
Thin film transistors
Design of Highly Stable Tungsten-Doped IZO Thin-Film Transistors With Enhanced Performance
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 页码: 1018-1022
作者:
Wan, Da
;
Liu, Xingqiang
;
Abliz, Ablat
;
Liu, Chuansheng
;
Yang, Yanbing
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/11/21
tungsten (W)-doping
pulsed current-voltage (I-V)
solution processed
Indium zinc oxide (IZO)
thin-film transistors (TFTs)
Enhanced Reliability of In-Ga-ZnO Thin-Film Transistors Through Design of Dual Passivation Layers
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 页码: 2844-2849
作者:
Abliz, Ablat
;
Wan, Da
;
Chen, Jui-Yuan
;
Xu, Lei
;
He, Jiawei
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/11/21
passivation layers (PVLs)
light illumination stress stability
Amorphous indium-gallium-zinc oxide (a-In-Ga-ZnO)
thin film transistors (TFTs)
Enhanced Electrical Performance and Negative Bias Illumination Stability of Solution-Processed InZnO Thin-Film Transistor by Boron Addition
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 页码: 520-525
作者:
Zhong, De-Yao[1]
;
Li, Jun[2]
;
Zhao, Cheng-Yu[3]
;
Huang, Chuan-Xin[4]
;
Zhang, Jian-Hua[5]
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/24
B doping concentration
boron-doped indium-zinc-oxide (BIZO) thin-film transistors (TFTs)
negative bias illumination stress (NBIS) stability
solution process
Effect of La Addition on the Electrical Characteristics and Stability of Solution-Processed LaInO Thin-Film Transistors With High-k ZrO2 Gate Insulator
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 页码: 526-532
作者:
Zhao, Cheng-Yu[1]
;
Li, Jun[2]
;
Zhong, De-Yao[3]
;
Huang, Chuan-Xin[4]
;
Zhang, Jian-Hua[5]
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2019/04/24
ZrO2 gate insulator
lanthanum(La) indium oxide (LaInO) thin-film transistors (TFTs)
solution process
stability
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