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Performance Analysis in Serial-section Electron Microscopy Image Registration of Neuronal Tissue 会议论文
美国圣地亚哥, 2022-1
作者:  Chen BH(陈波昊);  Xin T(辛桐);  Han H(韩华);  Chen X(陈曦)
收藏  |  浏览/下载:11/0  |  提交时间:2022/06/14
UTR: UNSUPERVISED LEARNING OF THICKNESS-INSENSITIVE REPRESENTATIONS FOR ELECTRON MICROSCOPE IMAGE 会议论文
美国阿拉斯加, 2021-10
作者:  Xin T(辛桐);  Chen BH(陈波昊);  Chen X(陈曦);  Han H(韩华)
收藏  |  浏览/下载:9/0  |  提交时间:2022/06/14
Using Scale Information to Improve SIFT-Based Electron Microscope Image Registration Method 会议论文
中国浙江省杭州市, 2019-9
作者:  Chen BH(陈波昊);  Chang S(常胜);  Chen X(陈曦);  Han H(韩华)
收藏  |  浏览/下载:3/0  |  提交时间:2022/06/14
Effects of five years' nitrogen deposition on soil properties and plant growth in a salinized reed wetland of the Yellow River Delta 期刊论文
ECOLOGICAL ENGINEERING, 2019, 卷号: 136, 页码: 160-166
作者:  Guan, B;  Xie, BH;  Yang, SS;  Hou, AX;  Chen, M
收藏  |  浏览/下载:30/0  |  提交时间:2020/07/08
Effects of afforestation on soil and ambient air temperature in a pair of catchments on the Chinese Loess Plateau 期刊论文
CATENA, 2019, 卷号: 175, 页码: 356-366
作者:  Jin, Z (Jin, Zhao);  Guo, L (Guo, Li);  Fan, BH (Fan, Bihang);  Lin, H (Lin, Henry);  Yu, YL (Yu, Yunlong)
收藏  |  浏览/下载:43/0  |  提交时间:2019/03/06
An APXPS endstation for gas-solid and liquid-solid interface studies at SSRF 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2019, 卷号: 30, 期号: 5, 页码: —
作者:  Cai, J;  Dong, Q;  Han, Y;  Mao, BH;  Zhang, H
收藏  |  浏览/下载:23/0  |  提交时间:2019/12/30
Total dose effect of Al2O3-based metal-oxide-semiconductor structures and its mechanism under gamma-ray irradiation 期刊论文
Semiconductor Science and Technology, 2018
作者:  Gao JT(高见头);  Li DL(李多力);  Li BH(李彬鸿);  Li B(李博);  Zheng ZS(郑中山)
收藏  |  浏览/下载:16/0  |  提交时间:2019/03/27
Multi-Angle Analysis of 30 MeV Silicon Ion Beam Irradiation Effects on InGaN/GaN Multiple Quantum Wells Blue Light Emitting Diodes 期刊论文
IEEE Transactions on Nuclear Science, 2018
作者:  Han ZS(韩郑生);  Zheng ZS(郑中山);  Li BH(李彬鸿);  Cui Y(崔岩);  Li B(李博)
收藏  |  浏览/下载:22/0  |  提交时间:2019/03/27
Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment 会议论文
作者:  Li BH(李彬鸿);  Huang Y(黄杨);  J.Wu;  Huang YB(黄云波);  Li B(李博)
收藏  |  浏览/下载:36/0  |  提交时间:2019/05/13
Process variation dependence of total ionizing dose effects in bulk nFinFETs 会议论文
作者:  Li B(李博);  Huang YB(黄云波);  L.Yang;  Zhang QZ(张青竹);  Zheng ZS(郑中山)
收藏  |  浏览/下载:46/0  |  提交时间:2019/05/13


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