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On the microstructure evolution of a nuclear-use steel after heavy ion irradiation 会议论文
广东深圳, 23 October 2020 到 25 October 2020
作者:  Song L;  Ye F;  Li JH(李江华);  Ma X;  Zhang R
收藏  |  浏览/下载:4/0  |  提交时间:2021/11/30
The threshold voltage degradation of MOSFET in heavy-ion single event effect test 会议论文
Beijing, China, May 16, 2018 - May 18, 2018
作者:  Zhang, Zeming;  Ma, Yingqi;  Li, Dan;  Tong, Chao;  Guo, Xiaoxiao
收藏  |  浏览/下载:23/0  |  提交时间:2019/12/26
Analysis of Heavy Ion Irradiation Field Nonuniformity Using Track Detectors during Electronic Components Testing 会议论文
Sweden, 2019
作者:  A.S. Bychkov;  P.A. Chubunov;  A.S. Konyukhov;  A.A. Pavlov
收藏  |  浏览/下载:6/0  |  提交时间:2021/05/25
Investigations of nano-defect morphology and vibrational spectra of swift heavy ion irradiated muscovite mica 会议论文
作者:  Zhang, S. X.;  Liu, J.;  Hu, P. P.;  Zeng, J.;  Maaz, K.
收藏  |  浏览/下载:56/0  |  提交时间:2019/03/27
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文
Geneva, SWITZERLAND, OCT 02-06, 2017
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载:38/0  |  提交时间:2018/10/08
The dependence of single event effect on heavy ion angular irradiation by Geant4 simulation 会议论文
作者:  Li B(李博);  Guo S(郭硕);  Hao L(郝乐);  Bi JS(毕津顺);  Luo JJ(罗家俊)
收藏  |  浏览/下载:13/0  |  提交时间:2019/05/10
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 会议论文
作者:  Yan, Weiwei;  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi
收藏  |  浏览/下载:40/0  |  提交时间:2018/08/20
Influence of the environment and phototoxicity of the live cell imaging system at IMP microbeam facility 会议论文
作者:  Liu, Wenjing;  Wei, Junzhe;  Wu, Ruqun;  Guo, Jinlong;  Du, Guanghua
收藏  |  浏览/下载:30/0  |  提交时间:2018/08/20
Influence of the environment and phototoxicity of the live cell imaging system at IMP microbeam facility 会议论文
作者:  Du, Guanghua;  Liu, Wenjing;  Wu, Ruqun;  Wei, Junzhe;  Chen, Hao
收藏  |  浏览/下载:25/0  |  提交时间:2018/08/20


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