Analysis of Heavy Ion Irradiation Field Nonuniformity Using Track Detectors during Electronic Components Testing

	Analysis of Heavy Ion Irradiation Field Nonuniformity Using Track Detectors during Electronic Components Testing
	A.S. Bychkov; P.A. Chubunov; A.S. Konyukhov; A.A. Pavlov
	2019
会议日期	2019
会议地点	Sweden
会议录	Proceedings of the 8th International Beam Instrumentation Conference
语种	英语
内容类型	会议论文
源URL	[http://ir.ihep.ac.cn/handle/311005/288684]
专题	高能物理研究所_学术会议_国际参会_JaCoW高能所参会会议_IBIC
作者单位	ISDE, Moscow, Russia
推荐引用方式 GB/T 7714	A.S. Bychkov,P.A. Chubunov,A.S. Konyukhov,et al. Analysis of Heavy Ion Irradiation Field Nonuniformity Using Track Detectors during Electronic Components Testing[C]. 见:. Sweden. 2019.