CORC

在结果中检索

CORC

浏览/检索结果: 共13条，第1-10条 帮助

已选(0)清除 条数/页：   排序方式：
Impact of High TID Irradiation on Stability of 65 nm SRAM Cells 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2022, 卷号: 69, 期号: 5, 页码: 1044-1050
作者:  Cui, JW (Cui, Jiangwei) [1];  Zheng, QW (Zheng, Qiwen) [1];  Li, YD (Li, Yudong) [1];  Guo, Q (Guo, Qi) [1]
收藏  |  浏览/下载：17/0  |  提交时间：2022/06/21
Total Ionizing Dose Effects of the Color Complementary Metal Oxide Semiconductor (CMOS) Image Sensor at Different Bias 期刊论文
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2022, 卷号: 17, 期号: 1, 页码: 121-127
作者:  Yang, ZK (Yang, Zhikang) [1] , [2];  Wen, L (Wen, Lin) [1];  Li, YD (Li, Yudong) [1];  Liu, BK (Liu, Bingkai) [1] , [2];  Fu, J (Fu, Jing) [1] , [2]
收藏  |  浏览/下载：20/0  |  提交时间：2022/06/21
Numerical and Experimental Investigation of TID Radiation Effects on the Breakdown Voltage of 400-V SOI NLDMOSFETs 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 页码: 710-715
作者:  Shu, Lei;  Wang, Liang;  Zhou, Xin;  Li, Tong-De;  Yuan, Zhang-Yi'an
收藏  |  浏览/下载：13/0  |  提交时间：2019/12/30
Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor 期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-10
作者:  Zhang, JX (Zhang, Jin-Xin)[ 1 ];  Guo, HX (Guo, Hong-Xia)[ 2,3 ];  Pan, XY (Pan, Xiao-Yu)[ 3 ];  Guo, Q (Guo, Qi)[ 2 ];  Zhang, FQ (Zhang, Feng-Qi)[ 3 ]
收藏  |  浏览/下载：38/0  |  提交时间：2018/11/20
Effects of recording time and residue on dose-response by LiMgPO4: Tb, B ceramic disc synthesized via improved sintering process 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 卷号: 422, 期号: 5, 页码: 2018-12-17
作者:  Kong, XR (Kong, Xirui);  Fu, ZL (Fu, Zhilong);  Que, HY (Que, Huiying);  Fan, YW (Fan, Yanwei);  Chen, ZY (Chen, Zhaoyang)
收藏  |  浏览/下载：44/0  |  提交时间：2018/07/20
The total ionizing dose effect on SiO2 and new high-k gate dielectrics under gamma-ray irradiation 会议论文
作者:  Ding, Man;  Cheng, Yonghong
收藏  |  浏览/下载：13/0  |  提交时间：2019/11/19
Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop 期刊论文
IEEE Transactions on Nuclear Science, 2018, 卷号: Vol.65 No.4, 页码: 997-1004
作者:  Zhuojun Chen;  Ding Ding;  Yemin Dong;  Yi Shan;  Shuxing Zhou
收藏  |  浏览/下载：16/0  |  提交时间：2019/12/26
Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology 期刊论文
2016, 2016
QIAO FengYing; PAN LiYang; YU Xiao; MA HaoZhi; WU Dong; XU Jun; QIAO FengYing; PAN LiYang; YU Xiao; MA HaoZhi; WU Dong; XU Jun
收藏  |  浏览/下载：4/0
Dose-rate sensitivity of deep sub-micro complementary metal oxide semiconductor process 期刊论文
ACTA PHYSICA SINICA, 2016, 卷号: 65, 期号: 7
作者:  Zheng, QW (Zheng Qi-Wen);  Cui, JW (Cui Jiang-Wei);  Wang, HN (Wang Han-Ning);  Zhou, H (Zhou Hang);  Yu, DZ (Yu De-Zhao)
收藏  |  浏览/下载：20/0  |  提交时间：2016/12/12
Total-ionizing-dose effects in pixel performance degradation of CMOS image sensors under low dose rate 期刊论文
International Conference on Nuclear Engineering, Proceedings, ICONE, 2015, 卷号: 2015-January
作者:  Xu, Shou-Long;  Zou, Shu-Liang
收藏  |  浏览/下载：4/0  |  提交时间：2019/12/27

©版权所有 ©2017 CSpace - Powered by CSpace