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期刊论文 [14]
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Smart Design of Resistive Switching Memory by an In Situ Current-Induced Oxidization Process on a Single Crystalline Metallic Nanowire
期刊论文
ADVANCED ELECTRONIC MATERIALS, 2021, 卷号: 7, 期号: 5, 页码: -
作者:
Shih, Yu-Chuan
;
Lee, Ling
;
Liang, Kai-De
;
Manikandan, Arumugam
;
Liu, Wen-Wu
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2021/03/12
Copper
Copper oxides
Nanocrystalline materials
Nanowires
Oxide minerals
RRAM
Single crystals
Fabrication process
High current densities
Random access memory
Resistive switching
Resistive switching memory
Switching behaviors
Switching mechanism
Switching properties
Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films
期刊论文
Journal of Applied Physics, 2020, 卷号: 128, 期号: 22
作者:
Feng, Y.P.
;
Tang, Y.L.
;
Zhu, Y.L.
;
Zou, M.J.
;
Wang, Y.J.
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2022/02/17
Domain walls
Ferroelectric films
Ferroelectric thin films
Ferroelectricity
Film thickness
High resolution transmission electron microscopy
Lead titanate
Perovskite
Piezoelectricity
Scanning electron microscopy
Scanning probe microscopy
Tantalum compounds
Domain configurations
Giant permittivity
Piezoelectric property
Piezoelectric response
Piezoresponse force microscopy
Scanning transmission electron microscopy
Square-root dependence
Switching behaviors
Charged domain wall modulation of resistive switching with large ON/OFF ratios in high density BiFeO3 nano-islands
期刊论文
Acta Materialia, 2020, 卷号: 187, 页码: 12-18
作者:
Han, M.J.
;
Tang, Y.L.
;
Wang, Y.J.
;
Zhu, Y.L.
;
Ma, J.Y.
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2020/11/14
Bismuth compounds
Digital storage
Heterojunctions
High resolution transmission electron microscopy
Iron compounds
Scanning probe microscopy
Switching
Transmission electron microscopy
Tunnel junctions
Charged domain wall
Conductive filaments
Macroscopic and microscopic
Nonvolatile memory devices
Piezoresponse force microscopy
Resistance switching behaviors
Resistive switching behaviors
Technological applications
Switching Transient Analysis for Normally-Off GaN Transistors with p-GaN Gate in a Phase-Leg Circuit
期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: 34, 页码: 3711-3728
作者:
Xie, Ruiliang
;
Yang, Xu
;
Xu, Guangzhao
;
Wei, Jin
;
Wang, Yuru
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2019/11/19
Analytical approach
GaN HEMTs
Junction capacitances
Physical behaviors
Schottky junctions
Switching transient
Terminal measurements
Threshold-voltage instabilities
Modulation of resistive switching in Pt/LiCoO2/SiO2/Si stacks
期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2019, 卷号: 30, 页码: 4753-4759
作者:
Hu, Qi
;
Huang, Anping
;
Zhang, Xinjiang
;
Li, Runmiao
;
Gao, Qin
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/30
Cobalt compounds
Platinum compounds
Pulsed laser deposition
Silicon compounds
Switching
Annealing temperatures
High-resistance state
Non-homogeneous
Resistance state
Resistive switching
Resistive switching behaviors
State stability
Lithium compounds
Misfit strain relaxations of (101)-oriented ferroelectric PbTiO3/(La, Sr)(Al, Ta)O3 thin film systems
期刊论文
Journal of Materials Research, 2018, 卷号: 33, 期号: 24, 页码: 4156-4164
作者:
Feng, Yanpeng
;
Tang, Yunlong
;
Zhu, Yinlian
;
Zou, Minjie
;
Ma, Xiuliang
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2020/11/14
Aluminum metallography
Crystallography
Ferroelectric films
Ferroelectric thin films
Ferroelectricity
High resolution transmission electron microscopy
Lead titanate
Pulsed laser deposition
Scanning electron microscopy
Strain relaxation
Tantalum metallography
Titanium compounds
Transmission electron microscopy
Transmissions
Dielectricity
Gaining insights
High index
High quality
Misfit strain relaxation
Misfit strains
Switching behaviors
Thin film systems
Annealing effect on the bipolar resistive switching characteristics of a Ti-Si3N4-n-GaN MIS device
期刊论文
Journal of Alloys and Compounds, 2018, 卷号: 740, 页码: 816-822
作者:
Chen, Y. R.
;
Li, Z. M.
;
Zhang, Z. W.
;
Hu, L. Q.
;
Jiang, H.
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/09/17
Data storage materials
Resistive switching
Metal-insulator-semiconductor
Annealing effect
Nonvolatile memory
nonvolatile memory
behaviors
mechanism
breakdown
layer
power
ti
Chemistry
Materials Science
Metallurgy & Metallurgical Engineering
Switching transient analysis for normally-Off GaN transistors with p-GaN gate in a phase-Leg circuit
会议论文
作者:
Xie, Ruiliang
;
Xu, Guangzhao
;
Yang, Xu
;
Wang, Hanxing
;
Tian, Mofan
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2019/11/26
Analysis approach
Dynamic behaviors
Gallium Nitride (GaN)
Gan transistors
Intrinsic capacitance
Static measurements
Switching transient
Threshold-voltage instabilities
Mechanism for an enhanced resistive switching effect of bilayer NiOx/TiO2 for resistive random access memory
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 722, 页码: 753-759
作者:
Zhou,Guangdong
;
Xiao,Lihua
;
Zhang,Shuangju
;
Wu,Bo
;
Liu,Xiaoqin
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2017/10/23
Electric-field
Devices
Bipolar
Films
Heterostructures
Transition
Behaviors
Filament
Matrix
Cells
Bilay Niox/tio2 Films
Resistive Switching Memory
Migration Of Oxygen Vacancy
Ag Conduction Filamens
Tunable defect engineering in TiON thin films by multi-step sputtering processes: From a Schottky diode to resistive switching memory
期刊论文
Journal of Materials Chemistry C, 2017, 卷号: 5, 期号: 25, 页码: 6319-6327
作者:
Su, Teng-Yu
;
Huang, Chi-Hsin
;
Shih, Yu-Chuan
;
Wang, Tsang-Hsuan
;
Medina, Henry
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2020/11/14
Defects
Diodes
Rhenium compounds
RRAM
Schottky barrier diodes
Sputtering
Switching
Thin films
Titanium compounds
Conduction Mechanism
Defect distribution
Gradient distributions
Rectifying characteristics
Rectifying properties
Resistive Random Access Memory (ReRAM)
Resistive switching behaviors
Resistive switching memory
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