Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films | |
Feng, Y.P.2,3; Tang, Y.L.1; Zhu, Y.L.1; Zou, M.J.2,3; Wang, Y.J.1; Ma, X.L.1,4 | |
刊名 | Journal of Applied Physics |
2020-12-14 | |
卷号 | 128期号:22 |
关键词 | Domain walls Ferroelectric films Ferroelectric thin films Ferroelectricity Film thickness High resolution transmission electron microscopy Lead titanate Perovskite Piezoelectricity Scanning electron microscopy Scanning probe microscopy Tantalum compounds Domain configurations Giant permittivity Piezoelectric property Piezoelectric response Piezoresponse force microscopy Scanning transmission electron microscopy Square-root dependence Switching behaviors |
ISSN号 | 00218979 |
DOI | 10.1063/5.0028929 |
英文摘要 | It is known that high-index perovskite ferroelectric thin films exhibit giant permittivity, piezoelectric response, and a particular switching behavior. However, the fine domain configuration in high-index ferroelectric films is not yet clarified, which triggers difficulties to further modulate their electric properties. In this work, we focus on the tetragonal PbTiO3 thin films with thicknesses of 20, 40, 55, and 70 nm deposited on a [101]-oriented KTaO3 substrate. By using piezoresponse force microscopy and state-of-the-art scanning transmission electron microscopy, the stripe a/c domains with alternately wide c and narrow a domains are observed in all these PbTiO3 films. The periodic stripe a/c domains with {101} domain walls extend along the in-plane [11 1 ¯] or [1 1 ¯ 1 ¯] direction, which almost completely relaxes the misfit strain between the PbTiO3 films and the KTaO3 substrate. The domain width decreases as the film thickness is reduced following the square root dependence. This results in an increase of ferroelastic a/c domain walls and promotes the enhancement of the piezoresponse amplitude for the thinner PbTiO3 films. In addition, the piezoresponse amplitude of a 20 nm PbTiO3 film is comparable to that of a 40 nm PbTiO3 film, which indicates that the piezoelectric response of ferroelectric films may saturate at a certain film thickness and scarcely increase even after the film thickness reduces further. These results clarify the domain configurations of [101]-oriented PbTiO3 thin films and provide useful information for understanding the relationship between microstructures and piezoelectric properties in ferroelectric films. © 2020 Author(s). |
WOS研究方向 | Physics |
语种 | 英语 |
出版者 | American Institute of Physics Inc. |
WOS记录号 | WOS:000598499100002 |
内容类型 | 期刊论文 |
源URL | [http://ir.lut.edu.cn/handle/2XXMBERH/151092] |
专题 | 兰州理工大学 |
作者单位 | 1.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, Shenyang; 110016, China; 2.Songshan Lake Materials Laboratory, Dongguan, Guangdong; 523808, China; 3.Institute of Physics, Chinese Academy of Sciences, Beijing; 100190, China; 4.State Key Lab of Advanced Processing and Recycling on Non-ferrous Metals, Lanzhou University of Technology, Langongping Road 287, Lanzhou; 730050, China |
推荐引用方式 GB/T 7714 | Feng, Y.P.,Tang, Y.L.,Zhu, Y.L.,et al. Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films[J]. Journal of Applied Physics,2020,128(22). |
APA | Feng, Y.P.,Tang, Y.L.,Zhu, Y.L.,Zou, M.J.,Wang, Y.J.,&Ma, X.L..(2020).Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films.Journal of Applied Physics,128(22). |
MLA | Feng, Y.P.,et al."Thickness-dependent evolution of piezoresponses and a / c domains in [101]-oriented PbTiO3ferroelectric films".Journal of Applied Physics 128.22(2020). |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论