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科研机构
半导体研究所 [16]
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期刊论文 [16]
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2010 [1]
2008 [1]
2006 [2]
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2002 [2]
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半导体物理 [16]
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Band crossing in isovalent semiconductor alloys with large size mismatch: First-principles calculations of the electronic structure of Bi and N incorporated GaAs
期刊论文
physical review b, 2010, 卷号: 82, 期号: 19, 页码: art. no. 193204
Deng HX (Deng Hui-Xiong)
;
Li JB (Li Jingbo)
;
Li SS (Li Shu-Shen)
;
Peng HW (Peng Haowei)
;
Xia JB (Xia Jian-Bai)
;
Wang LW (Wang Lin-Wang)
;
Wei SH (Wei Su-Huai)
收藏
  |  
浏览/下载:47/0
  |  
提交时间:2010/12/27
IMPURITIES
GAAS1-XNX
NITROGEN
GAINNAS
STATES
TRAPS
Optical study of lateral carrier transfer in (In,Ga)As/GaAs quantum-dot chains
期刊论文
applied physics letters, 2008, 卷号: 93, 期号: 1, 页码: art. no. 011107
Wang, BR
;
Sun, BQ
;
Ji, Y
;
Dou, XM
;
Xu, ZY
;
Wang, ZM
;
Salamo, GJ
收藏
  |  
浏览/下载:104/2
  |  
提交时间:2010/03/08
LOCALIZED STATES
ISLANDS
WIRES
SUPERLATTICES
ORGANIZATION
GAAS(100)
EXCITONS
GROWTH
DECAY
GAAS
Deep level transient spectroscopy studies of Er and Pr implanted GaN films
期刊论文
acta physica sinica, 2006, 卷号: 55, 期号: 3, 页码: 1407-1412
Song SF
;
Chen WD
;
Xu ZJ
;
Xu XR
收藏
  |  
浏览/下载:45/0
  |  
提交时间:2010/04/11
GaN
Er
Pr-implautation
deep level transient spectroscopy
N-TYPE GAN
DEFECTS
EPITAXY
TRAPS
Interdot interaction induced zero-bias maximum of the differential conductance in parallel double quantum dots
期刊论文
journal of applied physics, 2006, 卷号: 99, 期号: 4, 页码: art.no.043705
Chi F
;
Li SS
收藏
  |  
浏览/下载:93/0
  |  
提交时间:2010/04/11
AHARONOV-BOHM INTERFEROMETER
SINGLE-ELECTRON TRANSISTOR
COULOMB-BLOCKADE
ANDERSON MODEL
MAGNETIC-FLUX
KONDO REGIME
TRANSPORT
EQUILIBRIUM
DEVICES
Magnetic properties and rectifying behaviour of silicon doped with gadolinium
期刊论文
acta physica sinica, 2003, 卷号: 52, 期号: 6, 页码: 1469-1473
Zhou JP
;
Chen NF
;
Song SL
;
Chai CL
;
Yang SY
;
Liu ZK
;
Lin LY
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2010/08/12
magnetic semiconductor
magnetic p-n junction
ion beam epitaxy
gadolinium silicides
METAL-INSULATOR-TRANSITION
P-N-JUNCTION
INDUCED FERROMAGNETISM
SI/SIER INTERFACE
BEAM EPITAXY
SEMICONDUCTORS
EXCITATION
MAGNETORESISTANCE
ALLOYS
Dose rate dependence of electrical characteristics of lead zirconate titanate capacitors
期刊论文
japanese journal of applied physics part 1-regular papers short notes & review papers, 2003, 卷号: 42, 期号: 10, 页码: 6491-6495
Zhang GQ
;
Sun P
;
Zou Q
;
Mei X
;
Ruda HE
;
Gu Q
;
Yu XF
;
Ren DY
;
Yan RL
收藏
  |  
浏览/下载:1271/12
  |  
提交时间:2010/08/12
ionizing radiation
dose rate
PZT
dielectric constant
coercive field
C-V curves
remanent polarization
FERROELECTRIC PZT CAPACITORS
IONIZING-RADIATION
BORDER TRAPS
TRANSISTORS
DEGRADATION
MECHANISMS
MEMORIES
VOLTAGE
DEVICES
RAY
Transient photoconductivity and its light-induced change of lightly boron-doped a-Si : H films
期刊论文
acta physica sinica, 2002, 卷号: 51, 期号: 1, 页码: 111-114
Zhang SB
;
Kong GL
;
Xu YY
;
Wang YQ
;
Diao HW
;
Liao XB
收藏
  |  
浏览/下载:93/12
  |  
提交时间:2010/08/12
amorphous silicon
transient photoconductivity
light-induced change
Deep levels in semi-insulating InP obtained by annealing under iron phosphide ambiance
期刊论文
journal of applied physics, 2002, 卷号: 92, 期号: 4, 页码: 1968-1970
Dong HW
;
Zhao YW
;
Zhang YH
;
Jiao JH
;
Zhao JQ
;
Lin LY
收藏
  |  
浏览/下载:63/15
  |  
提交时间:2010/08/12
FE-DOPED INP
SEMIINSULATING INP
UNDOPED INP
SPECTROSCOPY
WAFER
UNIFORMITY
PRESSURE
TRAPS
Hydrostatic pressure effect on photoluminescence from a GaN0.015As0.985/GaAs quantum well
期刊论文
applied physics letters, 2001, 卷号: 78, 期号: 23, 页码: 3595-3597
Tsang MS
;
Wang JN
;
Ge WK
;
Li GH
;
Fang ZL
;
Chen Y
;
Han HX
;
Li LH
;
Pan Z
收藏
  |  
浏览/下载:98/11
  |  
提交时间:2010/08/12
GAINNAS ALLOYS
BAND-STRUCTURE
GAAS
NITROGEN
GAN(X)AS1-X
IMPURITIES
BEHAVIOR
MASS
Studies of high DC current induced degradation in III-V nitride based heterojunctions
期刊论文
ieee transactions on electron devices, 2000, 卷号: 47, 期号: 7, 页码: 1421-1425
Ho WY
;
Surya C
;
Tong KY
;
Lu LW
;
Ge WK
收藏
  |  
浏览/下载:38/0
  |  
提交时间:2010/08/12
current stressing
DLTS
flicker noise
heterojunctions
III-V nitride
LOW-FREQUENCY FLUCTUATIONS
RESONANT-TUNNELING DIODES
FLICKER NOISE
GALLIUM NITRIDE
1/F NOISE
DEVICES
TRANSISTORS
QUALITY
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