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Gradient growth of fcc and bcc phase within FexNi1-x (50 < x < 75) films during direct-current wafer electroplating
期刊论文
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2020, 卷号: 498, 页码: 6
作者:
Gao, Li-Yin
;
Wan, Peng
;
Liu, Zhi-Quan
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2021/02/02
Fe-Ni
Electrodeposition
Transmission electron microscopy (TEM)
Interfacial structure
Gradient growth of fcc and bcc phase within FexNi1-x (50 < x < 75) films during direct-current wafer electroplating
期刊论文
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2020, 卷号: 498, 页码: 6
作者:
Gao, Li-Yin
;
Wan, Peng
;
Liu, Zhi-Quan
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2021/02/02
Fe-Ni
Electrodeposition
Transmission electron microscopy (TEM)
Interfacial structure
Wafer-level optoelectronic packaging
专利
专利号: WO2019086953A1, 申请日期: 2019-05-09, 公开日期: 2019-05-09
作者:
LAM, YEE, LOY
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  |  
浏览/下载:14/0
  |  
提交时间:2019/12/30
Process development and reliability for wafer-level 3D IC integration using micro-bump/adhesive hybrid bonding and via-last TSVs
会议论文
19th International Conference on Electronic Packaging Technology, ICEPT 2018, Shanghai, China, 2018-08-08
作者:
Yao, Mingjun
;
Zhao, Ning
;
Yu, Daquan
;
Xiao, Zhiyi
;
Ma, Haitao
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2019/12/02
Process development and reliability for wafer-level 3D IC integration using micro- bump/adhesive hybrid bonding and via-last TSVs
会议论文
2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2018-01-01
作者:
Yao, Mingjun
;
Zhao, Ning
;
Yu, Daquan
;
Xiao, Zhiyi
;
Ma, Haitao
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/02
3D IC
wafer-level hybrid bonding
insert Cu pillar solder bump
dry film adhesive
TSVs
reliability
Optimization and Characterization of Low-Temperature Wafer-Level Hybrid Bonding Using Photopatternable Dry Film Adhesive and Symmetric Micro Cu Pillar Solder Bumps
期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 页码: 1855-1862
作者:
Yao, Mingjun
;
Zhao, Ning
;
Wang, Teng
;
Yu, Daquan
;
Xiao, Zhiyi
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2019/12/02
3-D IC
bump
dry film adhesive
wafer-level hybrid bonding
Enhancing airtightness of TGV through regulating interface energy for wafer-level vacuum packaging
期刊论文
Microsystem Technologies, 2018, 卷号: Vol.24 No.9, 页码: 3645-3649
作者:
Yunbin Kuang
;
Dingbang Xiao
;
Jian Zhou
;
Ming Zhuo
;
Wenyin Li
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/26
Investigation the Effect of Silane onto Fabricating Polymer Insulation Layer by Spin-coating for Through Silicon Vias
会议论文
Harbin, China
作者:
Qiang Liu
;
Guoping Zhang
;
Rong Sun
;
S. W. Ricky Lee
;
Ching-Ping Wong
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  |  
浏览/下载:14/0
  |  
提交时间:2018/02/02
The mathematical model and novel final test system for wafer-level packaging
期刊论文
IEEE Transactions on Industrial Informatics, 2017, 卷号: 13, 期号: 4, 页码: 1817-1824
作者:
Li, Junhui*
;
Tian, Wenya
;
Liao, Hailong
;
Zhou, Can
;
Liu, Xiaohe
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/03
Automatic final test
integrated circuit (IC) modeling
mathematical model
measurement techniques
microprobe final test
through-silicon vias
Solid-State-Diffusion Bonding for Wafer-Level Fine-Pitch Cu/Sn/Cu Interconnect in 3-D Integration
期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2017, 卷号: 7, 页码: 19-26
作者:
Wang, Junqiang
;
Wang, Qian
;
Wu, Zijian
;
Wang, Dejun
;
Cai, Jian
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/12/02
Cu/Sn/Cu interconnect
fine-pitch interconnect
solid-state-diffusion (SSD) bonding
wafer-level bonding
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