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华南理工大学 [13]
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会议论文 [9]
会议 [4]
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Hermetic Packaging of Kovar Alloy and Low-carbon Steel Structure in Hybrid Integrated Circuit (HIC) System Using Parallel Seam Welding Proces (CPCI-S收录)
会议论文
2014 15TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)
作者:
Wang, Junde[1]
;
He, Xiaoqi[1]
;
Li, Xunping[1]
;
En, Yunfei[1]
;
Zhang, Xinping[2]
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/04/12
hermetic packaging
parallel seam welding
microstructure
welding temperature field
Effect of Pb Content on Thermal Fatigue Life of Mixed SnAgCu-SnPb Solder Joints (CPCI-S收录)
会议
作者:
Wen Qiang[1,2]
;
Li Xunping[2]
;
Li Guoyuan[1]
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/04/11
Mixed solder joints
Pb content
Thermal fatigue life
Research on thermal-electric coupling effect of the Copper Pillar Bump in the Flip Chip Packaging (CPCI-S收录)
会议
作者:
Fu Zhiwei[1,2]
;
Zhou Bin[1,2]
;
Yao Ruohe[1]
;
Li Xunping[2]
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/11
Copper pillar bumps
thermal-electric coupling
Joule heat effcet
current density
Research on thermal-electric coupling effect of the copper pillar bump in the flip chip packaging (EI收录)
会议
Wuhan, China,
作者:
Fu, Zhiwei[1,2]
;
Zhou, Bin[1,2]
;
Yao, Ruohe[1]
;
Li, Xunping[2]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/11
Copper
Current density
Electronics packaging
Joule heating
Packaging
Stress concentration
Temperature distribution
Effect of Pb content on thermal fatigue life of mixed SnAgCu-SnPb solder joints (EI收录)
会议
Wuhan, China,
作者:
Wen, Qiang[1,2]
;
Li, Xunping[2]
;
Li, Guoyuan[1]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/11
Electronics packaging
Lead
Lead
free solders
Microstructural evolution
Scanning electron microscopy
Soldered joints
Thermal fatigue
Critical factors on the hermetic characteristics of DC/DC power module (EI收录)
会议论文
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, Suzhou, China, July 15, 2013 - July 19, 2013
作者:
Li, Xunping[1]
;
He, Xiaoqi[1]
;
En, Yunfei[1]
;
Qi, Guo[2]
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/15
Failure analysis
Finite element method
Glass
Integrated circuits
The effect of Pb contamination on the solidification behaviors and mechanical properties of backward compatible solder joints (EI收录)
会议论文
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, Suzhou, China, July 15, 2013 - July 19, 2013
作者:
Li, Xunping[1]
;
Bin, Zhou[1]
;
En, Yunfei[1]
;
Xiaoqi, He[1]
;
Wei, Xiongfeng[2]
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/15
Failure analysis
Integrated circuits
Lead
Mechanical properties
Melting point
Microstructure
Silver
Soldered joints
Soldering alloys
Solidification
Evaluation of PCB Constraint on Hermeticity Reliability of DC/DC Power Module by FEA Method (CPCI-S收录)
会议论文
PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II
作者:
Zeng, Ling[1,2]
;
Li, Xunping[1]
;
He, Xiaoqi[1]
;
Li, Guoyuan[1]
;
Bao, Hengwei[3]
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/12
Hermeticity
DC/DC power module
PCB
FEA
Key Factors on the Accuracy of Measurement Temperature by Using Infrared Thermometer (CPCI-S收录)
会议论文
PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II
作者:
Zeng, Ling[1,2]
;
Li, Xunping[1]
;
He, Xiaoqi[1]
;
Li, Guoyuan[1]
;
Wang, Zhangchao[3]
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/12
infrared thermometer
DC/DC power module
measurement accuracy
Effects of Pb content on solidification behavior and microstructure on mixed solder alloy (EI收录)
会议论文
Proceedings - 2013 14th International Conference on Electronic Packaging Technology, ICEPT 2013, Dalian, China, August 11, 2013 - August 14, 2013
作者:
Wei, Xiongfeng[1,2]
;
Li, Xunping[2]
;
Zhoubin[2]
;
Wei, Guoqiang[1]
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/04/15
Alloys
Electronics packaging
Eutectics
Lead
Microstructural evolution
Microstructure
Phase diagrams
Silver
Silver alloys
Soldering
Soldering alloys
Solidification
Tin alloys
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