CORC

浏览/检索结果: 共6条,第1-6条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
The threshold voltage degradation of MOSFET in heavy-ion single event effect test 会议论文
Beijing, China, May 16, 2018 - May 18, 2018
作者:  Zhang, Zeming;  Ma, Yingqi;  Li, Dan;  Tong, Chao;  Guo, Xiaoxiao
收藏  |  浏览/下载:23/0  |  提交时间:2019/12/26
The total ionizing dose effect of magnetometers system based on tunneling magnetoresistance sensor 会议论文
作者:  Li Huang;  Tianyang Zhang;  Bo Li;  Yu Zhang;  Yuhong Zhao
收藏  |  浏览/下载:27/0  |  提交时间:2019/05/10
The total ionizing dose effect on SiO2 and new high-k gate dielectrics under gamma-ray irradiation 会议论文
作者:  Ding, Man;  Cheng, Yonghong
收藏  |  浏览/下载:13/0  |  提交时间:2019/11/19
An Effective Method to Compensate Total Ionizing Dose-Induced Degradation on Double-SOI Structure 会议论文
作者:  Huang, Yang;  Li, Binhong;  Zhao, Xing;  Zheng, Zhongshan;  Gao, Jiantou
收藏  |  浏览/下载:16/0  |  提交时间:2019/11/26
Synergistic effect of mixed neutron and gamma irradiation in bipolar operational amplifier OP07 会议论文
作者:  Liu Yan;  Chen Wei;  Yang Shanchao;  Jin Xiaoming;  He Chaohui
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/02
Primary total ionizing dose effect studies on Xilinx SoC irradiated with Co-60 gamma rays 会议论文
作者:  Zhang, Yao;  Du, Xin;  Du, Xuecheng;  He, Dongsheng;  Zhang, Lingang
收藏  |  浏览/下载:11/0  |  提交时间:2019/12/02


©版权所有 ©2017 CSpace - Powered by CSpace