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北京航空航天大学 [3]
计算技术研究所 [3]
兰州理工大学 [2]
金属研究所 [2]
长春光学精密机械与物... [1]
湖南大学 [1]
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期刊论文 [9]
会议论文 [3]
发表日期
2019 [12]
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An Adaptive Thermal-Aware ECC Scheme for Reliable STT-MRAM LLC Design
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 8, 页码: 1851-1860
作者:
Wu, Bi
;
Zhang, Beibei
;
Cheng, Yuanqing
;
Wang, Ying
;
Liu, Dijun
收藏
  |  
浏览/下载:70/0
  |  
提交时间:2019/12/10
Error correction code (ECC)
last level cache (LLC)
reliability
spin-transfer-torque magnetoresistive random-access memory (STT-MRAM)
temperature
Resistive Switching Behavior in Ferroelectric Heterostructures
期刊论文
SMALL, 2019, 卷号: 15, 期号: 32, 页码: 13
作者:
Wang, Zhan Jie
;
Bai, Yu
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2021/02/02
conductivity
ferroelectric heterostructures
ferroelectricity
resistive switching
Resistive Switching Behavior in Ferroelectric Heterostructures
期刊论文
SMALL, 2019, 卷号: 15, 期号: 32, 页码: 13
作者:
Wang, Zhan Jie
;
Bai, Yu
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2021/02/02
conductivity
ferroelectric heterostructures
ferroelectricity
resistive switching
Power and Area Efficient FPGA Building Blocks Based on Ferroelectric FETs
期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 卷号: 66, 期号: 5, 页码: 1780-1793
作者:
Chen, Xiaoming
;
Ni, Kai
;
Niemier, Michael T.
;
Han, Yinhe
;
Datta, Suman
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  |  
浏览/下载:61/0
  |  
提交时间:2019/08/16
Ferroelectric field-effect transistor (FeFET)
field-programmable gate array (FPGA)
lookup table (LUT)
routing switch
Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits
期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 1, 页码: 159-172
作者:
Chen, Xiaoming
;
Niemier, Michael
;
Hu, Xiaobo Sharon
;
Yin, Xunzhao
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  |  
浏览/下载:71/0
  |  
提交时间:2019/04/03
Ferroelectric FET (FeFET)
logic-in-memory (LiM)
nonvolatile (NV) memory
Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD.
期刊论文
IEEE Transactions on Circuits & Systems. Part I: Regular Papers., 2019, 卷号: Vol.66 No.1, 页码: 226-238
作者:
Zhao, Xiaoqing
;
Sun, Hongbin
;
Liu, Longjun
;
Yang, Yang
;
Dai, Liangliang
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  |  
浏览/下载:17/0
  |  
提交时间:2019/12/17
COMPUTER
storage
devices
*RANDOM
access
memory
*STATISTICAL
reliability
Stability and Variability Emphasized STT-MRAM Sensing Circuit with Performance Enhancement
会议论文
2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018, 2018-10-26
作者:
Han, M.
;
Cai, H.
;
Yang, J.
;
Naviner, L.
;
Wang, Y.
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  |  
浏览/下载:11/0
  |  
提交时间:2019/12/30
Convergence of numerical methods
Magnetic anisotropy
Magnetic recording
Magnetic storage
Magnetism
Random access storage
Timing circuits
Tunnel junctions
low Vdd performance
Magnetic random access memory
Magnetic tunnel junction
Performance enhancements
Perpendicular magnetic anisotropy
Process Variation
Sensing margin
STT-MRAM
MRAM devices
Stress Testing With Influencing Factors to Accelerate Data Race Software Failures
期刊论文
IEEE Transactions on Reliability, 2019
作者:
Qiu, K.
;
Zheng, Z.
;
Trivedi, K.S.
;
Yin, B.
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/12/30
Data structures
Estimation
Outages
Random access storage
Software reliability
Software testing
Stresses
Testing
Weibull distribution
Computer bugs
influencing factors
Instruction set
Random access memory
Relationship model
Software failure
Stress Testing
Time to failure
Program debugging
Redesigning pipeline when architecting STT-RAM as registers in rad-hard environment
期刊论文
SUSTAINABLE COMPUTING-INFORMATICS & SYSTEMS, 2019, 卷号: 22, 页码: 206-218
作者:
Gong, Zhiyao
;
Qiu, Keni
;
Chen, Weiwen
;
Ni, Yuanhui
;
Xu, Yuanchao
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2019/12/30
Electromagnetic waves
Embedded systems
Merging
Pipelines
Radiation hardening
Static random access storage
Data dependencies
Emerging non-volatile memory
High radiation resistance
Micro architectures
Nonvolatility
Single event
Single event upsets
Spin transfer torque
Radiation effects
High-frame frequency imaging system of large area CMOS image sensor
期刊论文
Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2019, 卷号: 27, 期号: 5, 页码: 1167-1177
作者:
Y.-H.Ning
;
H.Liu
;
Q.-L.Zhao
;
H.-Z.Guo
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2020/08/24
CMOS integrated circuits,Digital cameras,Dynamic random access storage,Image enhancement,Image sensors,Imaging systems,Median filters,Personnel training,Pixels,Signal to noise ratio,Specifications
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