Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits | |
Chen, Xiaoming1; Niemier, Michael2; Hu, Xiaobo Sharon2; Yin, Xunzhao2 | |
刊名 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS |
2019 | |
卷号 | 27期号:1页码:159-172 |
关键词 | Ferroelectric FET (FeFET) logic-in-memory (LiM) nonvolatile (NV) memory |
ISSN号 | 1063-8210 |
DOI | 10.1109/TVLSI.2018.2871119 |
英文摘要 | Among the beyond-complementary metal-oxide-semiconductor (CMOS) devices being explored, ferroelectric field-effect transistors (FeFETs) are considered as one of the most promising. FeFETs are being studied by all major semiconductor manufacturers, and experimentally, FeFETs are making rapid progress. FeFETs also stand out with the unique hysteretic Ids-Vgs characteristic that allows a device to function as both a switch and a nonvolatile (NV) storage element. We exploit this FeFET property to build two categories of fine-grained logic-in-memory (LiM) circuits: 1) ternary content addressable memory (TCAM) which integrates efficient and compact logic/processing elements into various levels of memory hierarchy; 2) basic logic function units for constructing larger and more complex LiM circuits. Two writing schemes (with and without negative supply voltages respectively) for FeFETs are introduced in our LiM designs. The resulting designs are compared with existing LiM approaches based on CMOS, magnetic tunnel junctions (MTJs), resistive random access memories (ReRAMs), ferrorelectric tunnel junctions (FTJs), etc., that afford the same circuit-level functionality. Simulation results show that FeFET-based NV TCAMs offer lower area overhead than MTJ (79%) and CMOS (42% less) equivalents, as well as better search energy-delay products (EDPs) than TCAM designs based on MTJ (149x), ReRAM (1.7x), and CMOS (1.3x) in array evaluations. NV FeFET-based LiM basic circuit blocks are also more efficient than functional equivalents based on MTJs in terms of propagation delay (4.2x) and dynamic power (2.5x). A case study for an FeFET-based LiM accumulator further demonstrates that by employing FeFET as both a switch and an NV storage element, the FeFET-based accumulator can save area (36%) and power consumption (40%) when compared with a conventional CMOS accumulator with the same structure. |
资助项目 | Semiconductor Research Corporation ; DARPA ; Innovative Project of Institute of Computing Technology, CAS[5120186140] ; SRC STARnet center, MARCO ; SRC STARnet center, DARPA |
WOS研究方向 | Computer Science ; Engineering |
语种 | 英语 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
WOS记录号 | WOS:000455117600016 |
内容类型 | 期刊论文 |
源URL | [http://119.78.100.204/handle/2XEOYT63/3496] |
专题 | 中国科学院计算技术研究所期刊论文_英文 |
通讯作者 | Yin, Xunzhao |
作者单位 | 1.Chinese Acad Sci, Inst Comp Technol, Key Lab Comp Architecture, Beijing 100190, Peoples R China 2.Univ Notre Dame, Dept Comp Sci & Engn, Notre Dame, IN 46556 USA |
推荐引用方式 GB/T 7714 | Chen, Xiaoming,Niemier, Michael,Hu, Xiaobo Sharon,et al. Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,2019,27(1):159-172. |
APA | Chen, Xiaoming,Niemier, Michael,Hu, Xiaobo Sharon,&Yin, Xunzhao.(2019).Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,27(1),159-172. |
MLA | Chen, Xiaoming,et al."Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits".IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 27.1(2019):159-172. |
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