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	Redesigning pipeline when architecting STT-RAM as registers in rad-hard environment
	Gong, Zhiyao; Qiu, Keni; Chen, Weiwen; Ni, Yuanhui; Xu, Yuanchao; Yang, Jianlei
刊名	SUSTAINABLE COMPUTING-INFORMATICS & SYSTEMS
	2019
卷号	22页码:206-218
关键词	Electromagnetic waves Embedded systems Merging Pipelines Radiation hardening Static random access storage Data dependencies Emerging non-volatile memory High radiation resistance Micro architectures Nonvolatility Single event Single event upsets Spin transfer torque Radiation effects
ISSN号	2210-5379
DOI	10.1016/j.suscom.2018.09.001
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000472062300019
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5918532
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Gong, Zhiyao,Qiu, Keni,Chen, Weiwen,et al. Redesigning pipeline when architecting STT-RAM as registers in rad-hard environment[J]. SUSTAINABLE COMPUTING-INFORMATICS & SYSTEMS,2019,22:206-218.
APA	Gong, Zhiyao,Qiu, Keni,Chen, Weiwen,Ni, Yuanhui,Xu, Yuanchao,&Yang, Jianlei.(2019).Redesigning pipeline when architecting STT-RAM as registers in rad-hard environment.SUSTAINABLE COMPUTING-INFORMATICS & SYSTEMS,22,206-218.
MLA	Gong, Zhiyao,et al."Redesigning pipeline when architecting STT-RAM as registers in rad-hard environment".SUSTAINABLE COMPUTING-INFORMATICS & SYSTEMS 22(2019):206-218.

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