Stress Testing With Influencing Factors to Accelerate Data Race Software Failures | |
Qiu, K.; Zheng, Z.; Trivedi, K.S.; Yin, B. | |
刊名 | IEEE Transactions on Reliability |
2019 | |
关键词 | Data structures Estimation Outages Random access storage Software reliability Software testing Stresses Testing Weibull distribution Computer bugs influencing factors Instruction set Random access memory Relationship model Software failure Stress Testing Time to failure Program debugging |
ISSN号 | 00189529 |
DOI | 10.1109/TR.2019.2895052 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5920867 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Qiu, K.,Zheng, Z.,Trivedi, K.S.,et al. Stress Testing With Influencing Factors to Accelerate Data Race Software Failures[J]. IEEE Transactions on Reliability,2019. |
APA | Qiu, K.,Zheng, Z.,Trivedi, K.S.,&Yin, B..(2019).Stress Testing With Influencing Factors to Accelerate Data Race Software Failures.IEEE Transactions on Reliability. |
MLA | Qiu, K.,et al."Stress Testing With Influencing Factors to Accelerate Data Race Software Failures".IEEE Transactions on Reliability (2019). |
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