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Stress Testing With Influencing Factors to Accelerate Data Race Software Failures
Qiu, K.; Zheng, Z.; Trivedi, K.S.; Yin, B.
刊名IEEE Transactions on Reliability
2019
关键词Data structures Estimation Outages Random access storage Software reliability Software testing Stresses Testing Weibull distribution Computer bugs influencing factors Instruction set Random access memory Relationship model Software failure Stress Testing Time to failure Program debugging
ISSN号00189529
DOI10.1109/TR.2019.2895052
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5920867
专题北京航空航天大学
推荐引用方式
GB/T 7714
Qiu, K.,Zheng, Z.,Trivedi, K.S.,et al. Stress Testing With Influencing Factors to Accelerate Data Race Software Failures[J]. IEEE Transactions on Reliability,2019.
APA Qiu, K.,Zheng, Z.,Trivedi, K.S.,&Yin, B..(2019).Stress Testing With Influencing Factors to Accelerate Data Race Software Failures.IEEE Transactions on Reliability.
MLA Qiu, K.,et al."Stress Testing With Influencing Factors to Accelerate Data Race Software Failures".IEEE Transactions on Reliability (2019).
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