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STAR Results from Au plus Au Fixed-Target Collisions at root(NN)-N-S=4.5 GeV 会议论文
作者:  Meehan, Kathryn;  Adamczyk, L.;  Adkins, J. K.;  Agakishiev, G.;  Aggarwal, M. M.
收藏  |  浏览/下载:46/0  |  提交时间:2018/08/20
The STAR beam energy scan phase II physics and upgrades 会议论文
作者:  Yang, Chi;  Adamczyk, L.;  Adkins, J. K.;  Agakishiev, G.;  Aggarwal, M. M.
收藏  |  浏览/下载:37/0  |  提交时间:2018/08/20
The STAR beam energy scan phase II physics and upgrades 会议论文
作者:  Yang, Chi;  Adamczyk, L.;  Adkins, J. K.;  Agakishiev, G.;  Aggarwal, M. M.
收藏  |  浏览/下载:31/0  |  提交时间:2018/08/20
Towards Measurements of Chiral Effects Using Identified Particles from STAR 会议论文
作者:  Wen, Liwen;  Adamczyk, L.;  Adkins, J. K.;  Agakishiev, G.;  Aggarwal, M. M.
收藏  |  浏览/下载:34/0  |  提交时间:2018/08/20
Towards Measurements of Chiral Effects Using Identified Particles from STAR 会议论文
作者:  Wen, Liwen;  Adamczyk, L.;  Adkins, J. K.;  Agakishiev, G.;  Aggarwal, M. M.
收藏  |  浏览/下载:30/0  |  提交时间:2018/08/20
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 会议论文
作者:  Yan, Weiwei;  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi
收藏  |  浏览/下载:40/0  |  提交时间:2018/08/20
Influence of heavy ion flux on single event effect testing in memory devices 会议论文
作者:  Xi, Kai;  Luo, Jie;  Liu, Jie;  Sun, Youmei;  Hou, Mingdong
收藏  |  浏览/下载:16/0  |  提交时间:2018/08/20
Influence of heavy ion flux on single event effect testing in memory devices 会议论文
作者:  Xi, Kai;  Sun, Youmei;  Luo, Jie;  Liu, Jie;  Liu, Tianqi
收藏  |  浏览/下载:18/0  |  提交时间:2018/08/20


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