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Detection of Oscillations in Process Control Loops From Visual Image Space Using Deep Convolutional Networks 期刊论文
IEEE/CAA Journal of Automatica Sinica, 2024, 卷号: 11, 期号: 4, 页码: 982-995
作者:  Tao Wang;  Qiming Chen;  Xun Lang;  Lei Xie;  Peng Li
收藏  |  浏览/下载：1/0  |  提交时间：2024/03/18
Hierarchical Viewpoint Planning for Complex Surfaces in Industrial Product Inspection 期刊论文
IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2023, 页码: 11
作者:  Wang, Shaohu;  Tong, Yuchuang;  Shang, Xiuqin;  Zhang, Zhengtao
收藏  |  浏览/下载：0/0  |  提交时间：2024/03/20
A pixel-level deep segmentation network for automatic defect detection 期刊论文
EXPERT SYSTEMS WITH APPLICATIONS, 2023, 卷号: 215, 页码: 11
作者:  Yang, Lei;  Xu, Shuai;  Fan, Junfeng;  Li, En;  Liu, Yanhong
收藏  |  浏览/下载：11/0  |  提交时间：2023/02/22
Deep learning based online metallic surface defect detection method for wire and arc additive manufacturing 期刊论文
ROBOTICS AND COMPUTER-INTEGRATED MANUFACTURING, 2023, 卷号: 80, 页码: 12
作者:  Li, Wenhao;  Zhang, Haiou;  Wang, Guilan;  Xiong, Gang;  Zhao, Meihua
收藏  |  浏览/下载：20/0  |  提交时间：2022/11/14
Modeling and Calibration of Active Thermal-Infrared Visual System for Industrial HMI 期刊论文
ELECTRONICS, 2022, 卷号: 11, 期号: 8, 页码: 14
作者:  Chen, Mengjuan;  Tian, Simeng;  He, Fan;  Fu, Qingqin;  Gu, Qingyi
收藏  |  浏览/下载：17/0  |  提交时间：2022/06/10
Phase Diversity-Based Fourier Ptychography for Varying Aberration Correction 期刊论文
FRONTIERS IN PHYSICS, 2022, 卷号: 10
作者:  Xiang, Meng;  Pan, An;  Liu, Jinpeng;  Xi, Teli;  Guo, Xin
收藏  |  浏览/下载：25/0  |  提交时间：2022/05/05
Visual inspection system for battery screen print using joint method with multi-level block matching and K nearest neighbor algorithm 期刊论文
Optik, 2022, 卷号: 250
作者:  Zhao, Zhuo;  Li, Bing;  Liu, Tongkun;  Zhang, Shaojie;  Lu, Jiasheng
收藏  |  浏览/下载：61/0  |  提交时间：2021/12/07
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
收藏  |  浏览/下载：35/0  |  提交时间：2022/09/19
Unsupervised Anomaly Detection for Surface Defects with Dual-Siamese Network 期刊论文
IEEE Transactions on Industrial Informatics, 2022, 卷号: 1, 期号: 1, 页码: 1-11
作者:  Tao X(陶显);  Da-Peng Zhang;  Ma WZ(马文治);  Hou ZX(侯占新);  Lu ZF(逯正峰)
收藏  |  浏览/下载：35/0  |  提交时间：2022/03/03
Metrology is a key component of the industrial value-added chain: an interview with Prof. Wolfgang Osten 期刊论文
Light-Science & Applications, 2022, 卷号: 11, 期号: 1, 页码: 6
作者:  S. Ding
收藏  |  浏览/下载：0/0  |  提交时间：2023/06/14

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