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CORC

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Impact of High TID Irradiation on Stability of 65 nm SRAM Cells 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2022, 卷号: 69, 期号: 5, 页码: 1044-1050
作者:  Cui, JW (Cui, Jiangwei) [1];  Zheng, QW (Zheng, Qiwen) [1];  Li, YD (Li, Yudong) [1];  Guo, Q (Guo, Qi) [1]
收藏  |  浏览/下载：17/0  |  提交时间：2022/06/21
Verification of SEU resistance in 65 nm high-performance SRAM with dual DICE interleaving and EDAC mitigation strategies 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2021, 卷号: 32, 期号: 12, 页码: 13
作者:  He, Ze;  Zhao, Shi-Wei;  Liu, Tian-Qi;  Cai, Chang;  Yan, Xiao-Yu
收藏  |  浏览/下载：64/0  |  提交时间：2022/01/12
Design and verification of multiple SEU mitigated circuits on SRAM-based FPGA system 期刊论文
MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 7
作者:  Yu, Jian;  Cai, Chang;  Ning, Bingxu;  Gao, Shuai;  Liu, Tianqi
收藏  |  浏览/下载：25/0  |  提交时间：2022/01/24
Field-Free 3T2SOT MRAM for Non-Volatile Cache Memories 期刊论文
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 卷号: 67, 期号: 12, 页码: 4660-4669
作者:  Wu, Bi;  Wang, Chao;  Wang, Zhaohao;  Wang, Ying;  Zhang, Deming
收藏  |  浏览/下载：41/0  |  提交时间：2021/12/01
Field-Free Switching of a Spin-Orbit-Torque Device Through Interlayer-Coupling-Induced Domain Walls 期刊论文
PHYSICAL REVIEW APPLIED, 2020, 卷号: 13, 期号: 4, 页码: 10
作者:  Zhao, Xiaotian;  Ji, Lianze;  Liu, Wei;  Li, Shangkun;  Liu, Long
收藏  |  浏览/下载：37/0  |  提交时间：2021/02/02
SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA 期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 12, 页码: 12
作者:  Cai, Chang;  Gao, Shuai;  Zhao, Peixiong;  Yu, Jian;  Zhao, Kai
收藏  |  浏览/下载：38/0  |  提交时间：2022/01/19
Total Ionizing Dose Influence on the Single-Event Multiple-Cell Upsets in 65-nm 6-T SRAM 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 6, 页码: 892-898
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载：74/0  |  提交时间：2019/11/10
Heavy-Ion Induced Single Event Upsets in Advanced 65 nm Radiation Hardened FPGAs 期刊论文
ELECTRONICS, 2019, 卷号: 8, 期号: 3, 页码: 13
作者:  Ke, Lingyun;  Zhao, Peixiong;  Liu, Jie;  Fan, Xue;  Cai, Chang
收藏  |  浏览/下载：108/0  |  提交时间：2019/11/10
Redesigning pipeline when architecting STT-RAM as registers in rad-hard environment 期刊论文
SUSTAINABLE COMPUTING-INFORMATICS & SYSTEMS, 2019, 卷号: 22, 页码: 206-218
作者:  Gong, Zhiyao;  Qiu, Keni;  Chen, Weiwen;  Ni, Yuanhui;  Xu, Yuanchao
收藏  |  浏览/下载：22/0  |  提交时间：2019/12/30
The Increased Single-Event Upset Sensitivity of 65-nm DICE SRAM Induced by Total Ionizing Dose 会议论文
Geneva, SWITZERLAND, OCT 02-06, 2017
作者:  Zheng, Qiwen;  Cui, Jiangwei;  Lu, Wu;  Guo, Hongxia;  Liu, Jie
收藏  |  浏览/下载：38/0  |  提交时间：2018/10/08

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