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科研机构
新疆理化技术研究所 [97]
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期刊论文 [89]
学位论文 [7]
会议论文 [1]
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2022 [1]
2021 [1]
2020 [1]
2018 [4]
2017 [6]
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Physics [42]
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A comparative study of different oxidation states of raw materials on the properties of a novel medium-entropy Co2.77Mn1.71Fe1.10Zn0.42O8 thermistor materials
期刊论文
MATERIALS CHEMISTRY AND PHYSICS, 2022, 卷号: 284, 期号: 5, 页码: 1-8
作者:
Wang, B (Wang, Bing) [1] , [2]
;
Yao, JC (Yao, Jincheng) [1]
;
Zhao, PJ (Zhao, Pengjun) [1]
;
Wang, JH (Wang, Junhua) [1]
;
Chang, AM (Chang, Aimin) [1]
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2022/06/06
Medium-entropy
NTC ceramics
Temperature sensors
Thermistor
Electrical properties
Preparation and properties of GAGG:Ce/glass composite scintillation material*
期刊论文
CHINESE PHYSICS B, 2021, 卷号: 30, 期号: 7, 页码: 1-6
作者:
Zhang, WJ (Zhang, Wei-Jie) 1
;
Wei, QH (Wei, Qin-Hua) 1
;
Shen, X (Shen, Xiao) 1
;
Tang, G (Tang, Gao) 1
;
Chen, ZH (Chen, Zhen-Hua) 1
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  |  
浏览/下载:25/0
  |  
提交时间:2021/08/09
GGAGCecomposite materialscintillatorglass matrixluminescence properties
Optoelectronic Performance Analysis of Low-Energy Proton Irradiation and Post-Thermal Annealing Effects on InGaAs Solar Cell
期刊论文
FRONTIERS IN PHYSICS, 2020, 卷号: 8, 期号: 11, 页码: 1-7
作者:
Zhuang, Y (Zhuang, Y.)[ 1 ]
;
Aierken, A (Aierken, A.)[ 1 ]
;
Lei, QQ (Lei, Q. Q.)[ 2,3 ]
;
Fang, L (Fang, L.)[ 4 ]
;
Shen, XB (Shen, X. B.)[ 2,3 ]
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  |  
浏览/下载:37/0
  |  
提交时间:2021/01/05
InGaAs solar cell
proton irradiation
displacement damage
degradation
annealing
Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor
期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-10
作者:
Zhang, JX (Zhang, Jin-Xin)[ 1 ]
;
Guo, HX (Guo, Hong-Xia)[ 2,3 ]
;
Pan, XY (Pan, Xiao-Yu)[ 3 ]
;
Guo, Q (Guo, Qi)[ 2 ]
;
Zhang, FQ (Zhang, Feng-Qi)[ 3 ]
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  |  
浏览/下载:38/0
  |  
提交时间:2018/11/20
Sige Hbt
Synergistic Effect
Single Event Effects
Total Ionizing Dose
Total ionizing dose effects in pinned photodiode complementary metal-oxide-semiconductor transistor active pixel sensor
期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 10, 页码: 1-5
作者:
Ma, LD (Ma, Lin-Dong)[ 1,2,3 ]
;
Li, YD (Li, Yu-Dong)[ 1,2 ]
;
Wen, L (Wen, Lin)[ 1,2 ]
;
Feng, J (Feng, Jie)[ 1,2 ]
;
Zhang, X (Zhang, Xiang)[ 1,2,3 ]
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  |  
浏览/下载:43/0
  |  
提交时间:2018/11/20
Cmos Active Pixel Sensor
Dark Current
Quantum Efficiency
Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor
期刊论文
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 3, 页码: 1-9
作者:
Li, XL (Li, Xiao-Long)
;
Lu, W (Lu, Wu)
;
Wang, X (Wang, Xin)
;
Yu, X (Yu, Xin)
;
Guo, Q (Guo, Qi)
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  |  
浏览/下载:22/0
  |  
提交时间:2018/05/14
Ionizing Radiation Damage
Enhanced Low Dose Rate Sensitivity (Eldrs)
Switched Temperature Irradiation
Gate-controlled Lateral Pnp Transistor (glPnp)
Effects of recording time and residue on dose-response by LiMgPO4: Tb, B ceramic disc synthesized via improved sintering process
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 卷号: 422, 期号: 5, 页码: 2018-12-17
作者:
Kong, XR (Kong, Xirui)
;
Fu, ZL (Fu, Zhilong)
;
Que, HY (Que, Huiying)
;
Fan, YW (Fan, Yanwei)
;
Chen, ZY (Chen, Zhaoyang)
收藏
  |  
浏览/下载:44/0
  |  
提交时间:2018/07/20
Limgpo4
Ceramic Disc
Tb
Osl
b
Recording Time
Bleaching Time
Total-ionizing Dose Effects
Orientations of nonlocal vibrational modes from combined experimental and theoretical sum frequency spectroscopy
期刊论文
CHEMICAL PHYSICS LETTERS, 2017, 卷号: 683, 期号: 9, 页码: 199-204
作者:
Chase, HM (Chase, Hilary M.)
;
Chen, SL (Chen, Shunli)
;
Fu, L (Fu, Li)
;
Upshur, MA (Upshur, Mary Alice)
;
Rudshteyn, B (Rudshteyn, Benjamin)
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  |  
浏览/下载:22/0
  |  
提交时间:2017/12/05
Sum Frequency Generation
Orientation Analysis
Interfaces
Dft Calculations
Analysis of proton and gamma-ray radiation effects on CMOS active pixel sensors
期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 11, 页码: 1-5
作者:
Ma, LD (Ma, Lindong)
;
Li, YD (Li, Yudong)
;
Guo, Q (Guo, Qi)
;
Wen, L (Wen, Lin)
;
Zhou, D (Zhou, Dong)
收藏
  |  
浏览/下载:36/0
  |  
提交时间:2018/01/08
Complementary Metal-oxide-semiconductor (Cmos) Active Pixel Sensor
Dark Current
Fixed-pattern Noise
Quantum Efficiency
An investigation of ionizing radiation damage in different SiGe processes
期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 8
作者:
Li, P (Li, Pei)
;
Liu, MH (Liu, Mo-Han)
;
He, CH (He, Chao-Hui)
;
Guo, HX (Guo, Hong-Xia)
;
Zhang, JX (Zhang, Jin-Xin)
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  |  
浏览/下载:16/0
  |  
提交时间:2017/12/11
Different Silicon-germanium Process
Ionizing Radiation Damage
Numerical Simulation
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