Optoelectronic Performance Analysis of Low-Energy Proton Irradiation and Post-Thermal Annealing Effects on InGaAs Solar Cell
Zhuang, Y (Zhuang, Y.)[ 1 ]; Aierken, A (Aierken, A.)[ 1 ]; Lei, QQ (Lei, Q. Q.)[ 2,3 ]; Fang, L (Fang, L.)[ 4 ]; Shen, XB (Shen, X. B.)[ 2,3 ]; Heini, M (Heini, M.)[ 2,3 ]; Guo, Q (Guo, Q.)[ 2,3 ]; Guo, J (Guo, J.)[ 1 ]; Yang, X (Yang, X.)[ 1 ]; Mo, JH (Mo, J. H.)[ 1 ]
刊名FRONTIERS IN PHYSICS
2020
卷号8期号:11页码:1-7
关键词InGaAs solar cell proton irradiation displacement damage degradation annealing
ISSN号2296-424X
DOI10.3389/fphy.2020.585707
英文摘要

The electrical and spectral properties of 150 KeV proton-irradiated MBE-grown In0.53Ga0.47As single junction solar cell and its post-thermal annealing properties were investigated. Both simulation and experimental methods were applied to analyze the irradiation-induced displacement damage and degradation mechanism of cell performance. The results show that most protons would penetrate through the In0.53Ga0.47As emitter and stop in the base region, causing differing extents of electric and spectral degredation. When proton fluence were 1 x 10(12) and 5 x 10(12) p/cm(2), the remaining factor of I-sc, V-oc, P-max,P- and FF were degraded to 0.790, 0.767, 0.558, 0.921 and 0.697, 0.500, 0.285, 0.817, respectively. Severer degradation was found in short wave lengths compared to long wave lengths of the solar cell spectral response. After annealing treatments, the normalized I-sc, V-oc, P-max, and FF, significantly recovered from 0.697, 0.500, 0.285, and 0.817 to 0.782, 0.700, 0.499, and 0.912 (fluence: 5 x 10(12) p/cm(2)), and the irradiation-induced defects in the whole emission area and part of the base area were annihilated, so the observed recovery of the short wavelength of the solar cell was greater than the long wavelength. The performance analysis in this work provided valuable ways to improve the photoelectric efficiency of space solar cells.

WOS记录号WOS:000592221300001
内容类型期刊论文
源URL[http://ir.xjipc.cas.cn/handle/365002/7695]  
专题新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室
作者单位1.Uniwatt Technol Co Ltd, Zhongshan, Peoples R China
2.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm Chin, Urumqi, Peoples R China
3.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Xinjiang Key Lab Elect Informat Mat & Devices, Urumqi, Peoples R China
4.Yunnan Normal Univ, Sch Energy & Environm Sci, Kunming, Yunnan, Peoples R China
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GB/T 7714
Zhuang, Y ,Aierken, A ,Lei, QQ ,et al. Optoelectronic Performance Analysis of Low-Energy Proton Irradiation and Post-Thermal Annealing Effects on InGaAs Solar Cell[J]. FRONTIERS IN PHYSICS,2020,8(11):1-7.
APA Zhuang, Y .,Aierken, A .,Lei, QQ .,Fang, L .,Shen, XB .,...&Zhang, SY .(2020).Optoelectronic Performance Analysis of Low-Energy Proton Irradiation and Post-Thermal Annealing Effects on InGaAs Solar Cell.FRONTIERS IN PHYSICS,8(11),1-7.
MLA Zhuang, Y ,et al."Optoelectronic Performance Analysis of Low-Energy Proton Irradiation and Post-Thermal Annealing Effects on InGaAs Solar Cell".FRONTIERS IN PHYSICS 8.11(2020):1-7.
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