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科研机构
半导体研究所 [10]
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期刊论文 [9]
会议论文 [1]
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2014 [1]
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光电子学 [10]
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Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography
期刊论文
ieee transactions on device and materials reliability, 2014, 卷号: 14, 期号: 1, 页码: 413-417
Qiao, YB
;
Feng, SW
;
Xiong, C
;
Zhu, H
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  |  
浏览/下载:35/0
  |  
提交时间:2015/03/16
Mode characteristics of metallically coated square microcavity connected with an output waveguide
期刊论文
journal of applied physics, 2010, 卷号: 107, 期号: 11, 页码: art. no. 113103
Che KJ (Che Kai-Jun)
;
Huang YZ (Huang Yong-Zhen)
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  |  
浏览/下载:48/0
  |  
提交时间:2010/07/05
finite difference time-domain analysis
microcavities
micro-optics
optical waveguides
Q-factor
reflectivity
refractive index
RESONATOR MICROLASERS
FDTD TECHNIQUE
EMISSION
FILTERS
CAVITY
LAYER
LASER
Mechanical Deformation Behavior of Nonpolar GaN Thick Films by Berkovich Nanoindentation
期刊论文
nanoscale research letters, 2009, 卷号: 4, 期号: 7, 页码: 753-757
作者:
Duan RF
;
Wei TB
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  |  
浏览/下载:96/0
  |  
提交时间:2010/03/08
GaN
Nonpolar
HVPE
Nanoindentation
Cathodoluminescence
Raman mapping
High-temperature AlN interlayer for crack-free AlGaN growth on GaN
期刊论文
journal of applied physics, 2008, 卷号: 104, 期号: 4, 页码: art. no. 043516
Sun, Q
;
Wang, JT
;
Wang, H
;
Jin, RQ
;
Jiang, DS
;
Zhu, JJ
;
Zhao, DG
;
Yang, H
;
Zhou, SQ
;
Wu, MF
;
Smeets, D
;
Vantomme, A
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  |  
浏览/下载:73/0
  |  
提交时间:2010/03/08
STRESS
SI(111)
REDUCTION
THICKNESS
Influence of AlN thickness on strain evolution of GaN layer grown on high-temperature AlN interlayer
期刊论文
journal of physics d-applied physics, 2007, 卷号: 40, 期号: 17, 页码: 5252-5255
Liu, W (Liu, W.)
;
Wang, JF (Wang, J. F.)
;
Zhu, JJ (Zhu, J. J.)
;
Jiang, DS (Jiang, D. S.)
;
Yang, H (Yang, H.)
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  |  
浏览/下载:56/0
  |  
提交时间:2010/03/29
STRESS
Reduction of dislocations in GaN epilayer grown on Si (111) substrates using a GaN intermedial layer
期刊论文
chinese physics letters, 2006, 卷号: 23, 期号: 9, 页码: 2591-2594
Wang JF (Wang Jian-Feng)
;
Zhang BS (Zhang Bao-Shun)
;
Zhang JC (Zhang Ji-Cai)
;
Zhu JJ (Zhu Jian-Jun)
;
Wang YT (Wang Yu-Tian)
;
Chen J (Chen Jun)
;
Liu W (Liu Wei)
;
Jiang DS (Jiang De-Sheng)
;
Yao DZ (Yao Duan-Zheng)
;
Yang H (Yang Hui)
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  |  
浏览/下载:29/0
  |  
提交时间:2010/04/11
CHEMICAL-VAPOR-DEPOSITION
HIGH-QUALITY GAN
ALN BUFFER LAYER
NUCLEATION LAYER
PHASE EPITAXY
EVOLUTION
DENSITY
SILICON
STRESS
SI
Thermal stress analysis for GaInAsP multiple quantum well wafer chemically bonded to Si (100)
期刊论文
journal of applied physics, 2006, 卷号: 100, 期号: 2, 页码: art.no.023513
Zhao HQ (Zhao Hong-Quan)
;
Yu LJ (Yu Li-Juan)
;
Huang YZ (Huang Yong-Zhen)
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  |  
浏览/下载:32/0
  |  
提交时间:2010/04/11
ACTIVATED BONDING METHOD
ROOM-TEMPERATURE
EPITAXIAL OVERGROWTHS
SURFACE
CRYSTAL
GAAS
TECHNOLOGY
ENERGY
FILMS
Analysis of Si/GaAs Bonding Stresses with the Finite Element Method
期刊论文
半导体学报, 2006, 卷号: 27, 期号: 11, 页码: 1906-1910
作者:
Cao Yulian
;
Chen Lianghui
;
Wu Xuming
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  |  
浏览/下载:19/0
  |  
提交时间:2010/11/23
Strain analysis of InP/InGaAsP wafer bonded on Si by X-ray double crystalline diffraction
期刊论文
materials science and engineering b-solid state materials for advanced technology, 2006, 卷号: 133, 期号: 1-3, 页码: 117-123
Zhao HQ (Zhao Hong-Quan)
;
Yu LJ (Yu Li-Juan)
;
Huang YZ (Huang Yong-Zhen)
;
Wang YT (Wang Yu-Tian)
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  |  
浏览/下载:31/0
  |  
提交时间:2010/04/11
InP
Si
X-ray double crystalline diffraction
thermal strain
wafer bonding
OPTOELECTRONIC DEVICES
EPITAXIAL OVERGROWTHS
TEMPERATURE
INTERFACE
STRESSES
VCSELS
SURFACES
ENERGY
Stress analysis of silica-based arrayed waveguide grating by a finite element method
会议论文
photonics asia symposium 2002, shanghai, peoples r china, oct 14-18, 2002
Deng XQ
;
Yang QQ
;
Wang HJ
;
Hu XW
;
Wang QM
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  |  
浏览/下载:18/0
  |  
提交时间:2010/10/29
finite element method
stress
silica optical waveguide on silicon
birefringence
OPTICAL WAVE-GUIDES
DIFFERENCE METHOD
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