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Atomic Oxygen Escape on Mars Driven by Electron Impact Excitation and Ionization
期刊论文
The Astronomical Journal, 2020, 卷号: 159, 期号: 2
作者:
Zhang,Q.
;
Gu,H.
;
Cui,J.
;
Cheng,Y.-M.
;
He,Z.-G.
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2020/03/10
Planetary atmospheres
Upper atmosphere
Electron impact ionization
Experimental investigation of the electron impact excitation behavior in pulse-modulated radio frequency Ar/O-2 inductively coupled plasma
期刊论文
JOURNAL OF APPLIED PHYSICS, 2019, 卷号: 125
作者:
Xue, Chan
;
Gao, Fei
;
Wen, De-Qi
;
Wang, You-Nian
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/02
CCD cameras
Charge coupled devices
Electric discharges
Electrons
Excited states
Impact ionization
Inductively coupled plasma
Plasma simulation
Radio waves, Bi-modal structures
Capacitive couplings
Discharge conditions
Electron-impact excitation
Experimental investigations
Inductive couplings
Intensified charge coupled device camera
Radio frequencies, Frequency modulation
Compact Model for Tunnel Diode Body Contact SOI n-MOSFETs
期刊论文
IEEE Transactions on Electron Devices, 2019, 卷号: Vol.66 No.1, 页码: 249-254
作者:
Yongwei Chang
;
Jiexin Luo
;
Jing Chen
;
Lingda Xu
;
Zhan Chai
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/13
MOSFET
circuits
Integrated
circuit
modeling
Semiconductor
device
modeling
Radio
frequency
MOSFET
Analytical
models
Mathematical
model
Body
contact
compact
model
floating
body
effects
(FBEs)
impact
ionization
partially
depleted
silicon-on-insulator
(PD-SOI)
radio
frequency
(RF)
tunnel
diode
body
contact
(TDBC)
Probing thermal decomposition mechanism of molten nitrite/nitrates salt by time of flight mass spectrometry
期刊论文
SOLAR ENERGY, 2019, 卷号: 183, 期号: -, 页码: 823—828
作者:
Fei, ZJ
;
Zhang, Y
;
Ge, M
;
Wang, YT
;
Li, YL
收藏
  |  
浏览/下载:183/0
  |  
提交时间:2019/12/30
ELECTRON-IMPACT IONIZATION
ENERGY STORAGE
CROSS-SECTIONS
SODIUM-NITRATE
STABILITY
SYSTEM
Observation of the indirect (e, 3e) process of CO
期刊论文
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2018, 卷号: 51, 期号: 18, 页码: 185203
作者:
Zhang, P.
;
Yan, S.
;
Ma, X.
;
Shen, L.
;
Xu, S.
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2018/10/08
double ionization
carbon monoxide
dissociation
electron impact
Observation of the indirect (e, 3e) process of CO
期刊论文
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2018, 卷号: 51
作者:
Zhang, P.
;
Yan, S.
;
Ma, X.
;
Shen, L.
;
Xu, S.
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/11/19
double ionization
electron impact
dissociation
carbon monoxide
Molecular orbital composition and its effect on electron-impact ionization cross sections of molecules: A comparative study
期刊论文
Physics of Plasmas, 2018, 卷号: 25
作者:
Zhong, Linlin
;
Wang, Xiaohua
;
Rong, Mingzhe
收藏
  |  
浏览/下载:98/0
  |  
提交时间:2019/11/26
Comparative studies
Electron-impact ionization cross sections
Ionization cross section
Mulliken analysis
Orbital composition
Population analysis
Quantum chemical computations
Theoretical approach
Multicenter three-distorted-wave approach to three-dimensional images for electron-impact-ionization dynamics of molecules: Overall agreement with experiment
期刊论文
Physical Review A, 2018, 卷号: 98
作者:
Gong, Maomao
;
Li, Xingyu
;
Zhang, Song Bin
;
Niu, Shanshan
;
Ren, Xueguang
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/11/26
Angular dependence
Ejected electrons
Electron impact-ionization
Fully differential cross sections
Neutral molecules
Three dimensional images
Three-dimensional kinematics
Triple differential cross sections
The interplay between the kinetic nonlinear frequency shift and the flowing gradient in stimulated Brillouin scattering.
期刊论文
Plasma Physics & Controlled Fusion, 2018, 卷号: Vol.60 No.2, 页码: 1
作者:
Wang, Q
;
Zheng, CY
;
Liu, ZJ
;
Xiao, CZ
;
Feng, QS
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/12/26
FREQUENCY
shift
keying
BRILLOUIN
scattering
INHOMOGENEOUS
plasma
PLASMA
flow
ELECTRON
impact
ionization
Abnormal Recovery Phenomenon Induced by Hole Injection During Hot Carrier Degradation in SOI n-MOSFETs
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
Lu, Ying-Hsin
;
Chang, Ting-Chang
;
Chen, Li-Hui
;
Lin, Yu-Shan
;
Liu, Xi-Wen
;
Liao, Jih-Chien
;
Lin, Chien-Yu
;
Lien, Chen-Hsin
;
Chang, Kuan-Chang
;
Zhang, Sheng-Dong
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Hole injection
hot carrier
impact ionization
abnormal recovery
P-MOSFETS
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