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Annealing-induced evolution in interface stability and electrical performance of sputtering-driven rare-earth-based gate oxides
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 卷号: 778, 期号: 无, 页码: 579-587
作者:
Wang, Die
;
He, Gang
;
Liang, Shuang
;
Liu, Mao
收藏
  |  
浏览/下载:56/0
  |  
提交时间:2020/03/31
Dy2O3 gate dielectrics
High-k
Annealing temperature
Optical properties
Electrical characteristics
Annealing-induced evolution in interface stability and electrical performance of sputtering-driven rare-earth-based gate oxides
期刊论文
Journal of Alloys and Compounds, 2019, 卷号: Vol.778, 页码: 579-587
作者:
Shuang Liang
;
Die Wang
;
Mao Liu
;
Gang He
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/04/24
DyO
gate
dielectrics
High-k
Annealing
temperature
Optical
properties
Electrical
characteristics
High-k Spacer Consideration of Ultrascaled Gate-All-Around Junctionless Transistor in Ballistic Regime
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 卷号: 65, 期号: 12, 页码: 5282-5288
作者:
Yang YM(杨育梅)
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  |  
浏览/下载:6/0
  |  
提交时间:2020/11/13
Ballistics
Dielectric materials
Drain current
Gate dielectrics
MOSFET devices
Poisson equation
Shims
Direct current performance
High- k
junctionless
Junctionless transistors
Non-equilibrium green functions
Nonequilibrium green function formalisms
Quantum simulators
Subthreshold characteristics
Interface Modulation and Optimization of Electrical Properties of HfGdO/GaAs Gate Stacks by ALD-Derived Al2O3 Passivation Layer and Forming Gas Annealing
期刊论文
ADVANCED ELECTRONIC MATERIALS, 2018, 卷号: 4, 期号: 4, 页码: 9
作者:
Jiang, Shanshan
;
He, Gang
;
Liu, Mao
;
Zhu, Li
;
Liang, Shuang
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  |  
浏览/下载:65/0
  |  
提交时间:2019/06/10
electrical properties
forming gas annealing
high-k gate dielectrics
interface chemistry
metal-oxide-semiconductor capacitors
Analysis of the electrical properties and current transportation mechanism of a metal oxide semiconductor (MOS) capacitor based on HfGdO gate dielectrics
期刊论文
Journal of Alloys and Compounds, 2018, 卷号: Vol.757, 页码: 288-297
作者:
J.G. Lv
;
Y.M. Liu
;
P.H. Wang
;
S.S. Jiang
;
G. He
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  |  
浏览/下载:4/0
  |  
提交时间:2019/04/22
High-k
gate
dielectrics
HfGdO
Electrical
properties
Metal
oxide
semiconductor
transistors
Leakage
current
density
Interface Modulation and Optimization of Electrical Properties of HfGdO/GaAs Gate Stacks by ALD‐Derived Al2O3 Passivation Layer and Forming Gas Annealing
期刊论文
Advanced Electronic Materials, 2018, 卷号: Vol.4 No.4
作者:
Wendong Li
;
Shuang Liang
;
Li Zhu
;
Mao Liu
;
Mingliang Tian
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  |  
浏览/下载:44/0
  |  
提交时间:2019/04/22
electrical
properties
forming
gas
annealing
high‐k
gate
dielectrics
interface
chemistry
metal‐oxide‐semiconductor
capacitors
Nontoxic, Eco‐friendly Fully Water‐Induced Ternary Zr–Gd–O Dielectric for High‐Performance Transistors and Unipolar Inverters
期刊论文
Advanced Electronic Materials, 2018, 卷号: Vol.4 No.5
作者:
Wendong Li
;
Li Zhu
;
Elvira Fortunato
;
Bing Yang
;
Gang He
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  |  
浏览/下载:4/0
  |  
提交时间:2019/04/22
eco‐friendly
electronics
electrical
properties
high‐k
gate
dielectrics
thin‐film
transistors
water‐induced
method
Modulation of interfacial and electrical properties of HfGdO/GaAs gate stacks by ammonium sulfide passivation and rapid thermal annealing
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 704, 期号: 无, 页码: 322-328
作者:
Jiang, S. S.
;
He, G.
;
Liang, S.
;
Zhu, L.
;
Li, W. D.
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2018/07/04
High-k Gate Dielectrics
Interface Chemistry
Xps Electrical Properties
Cmos Devices
Interfacial modulation and electrical properties improvement of solution-processed ZrO2 gate dielectrics upon Gd incorporation
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 699, 期号: 无, 页码: 415-420
作者:
Xiao, D. Q.
;
He, G.
;
Lv, J. G.
;
Wang, P. H.
;
Liu, M.
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2018/07/04
High-k Gate Dielectrics
Gd Incorporation
Xps
Electrical Properties
Sol-gel
Interface quality modulation, band alignment modification and optimization of electrical properties of HfGdO/Ge gate stacks by nitrogen incorporation
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 695, 期号: 无, 页码: 2199-2206
作者:
Gao, J.
;
He, G.
;
Fang, Z. B.
;
Lv, J. G.
;
Liu, M.
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  |  
浏览/下载:16/0
  |  
提交时间:2018/07/04
High-k Gate Dielectrics
Interface Quality
Band Alignment
Electrical Properties
Leakage Current Mechanism
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