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CORC

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The R&D efficiency of the Taiwanese semiconductor industry 期刊论文
MEASUREMENT, 2019, 卷号: 137
作者:  Wu, Hung-Yi;  Chen, I-Shuo;  Chen, Jui-Kuei;  Chien, Ching-Fan
收藏  |  浏览/下载：7/0  |  提交时间：2019/12/05
The Realization of a Topological Insulator Saturable Absorber-Based Mode-Locked Solid State Laser 会议论文
2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018, July 29, 2018 - August 3, 2018
作者:  Lan, Jiachi;  Wang, Yi-Ran;  Sung, Wei-Heng;  Zhang, Bai-Tao;  Wu, Chung-Lung
收藏  |  浏览/下载：6/0  |  提交时间：2019/12/31
The realization of a topological insulator saturable absorber-based mode-locked solid state laser 期刊论文
Optics InfoBase Conference Papers, 2018, 卷号: Part F113-CLEOPR 2018
作者:  Lan, Jiachi;  Wang, Yi-Ran;  Sung, Wei-Heng;  Zhang, Bai-Tao;  Wu, Chung-Lung
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/11
Exploring benchmark corporations in the semiconductor industry based on efficiency 期刊论文
Journal of High Technology Management Research, 2017, 卷号: 28, 期号: 2
作者:  Chen, Jui-Kuei;  Ye, Rih-Wei;  Chen, I-Shuo;  Tsai, Chia-Han;  Wu, Hung-Yi
收藏  |  浏览/下载：7/0  |  提交时间：2019/12/05
ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ESD Reliability Evaluations of the 60-V nLDMOS by the Drain-side Discrete SCRs 其他
2016-01-01
Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
LDMOS  
Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
LDMOS  
ESD reliability improvement of the 0.25-��m 60-V power nLDMOS with discrete embedded SCRs separated by STI structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03

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