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CORC

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Three-Dimensional Molybdenum Diselenide Helical Nanorod Arrays for High-Performance Aluminum-Ion Batteries 期刊论文
ACS Nano, 2020, 卷号: 14, 期号: 7, 页码: 8539-8550
作者:  Ai, Yuanfei;  Wu, Shu-Chi;  Wang, Kuangye;  Yang, Tzu-Yi;  Liu, Mingjin
收藏  |  浏览/下载：10/0  |  提交时间：2022/02/17
The numbers of fungi: is the descriptive curve flattening? 期刊论文
FUNGAL DIVERSITY, 2020
作者:  Hyde, Kevin D.;  Jeewon, Rajesh;  Chen, Yi-Jyun;  Bhunjun, Chitrabhanu S.;  Calabon, Mark S.
收藏  |  浏览/下载：23/0  |  提交时间：2021/01/05
One stop shop IV: taxonomic update with molecular phylogeny for important phytopathogenic genera: 76-100 (2020) 期刊论文
FUNGAL DIVERSITY, 2020
作者:  Jayawardena, Ruvishika S.;  Hyde, Kevin D.;  Chen, Yi Jyun;  Papp, Viktor;  Palla, Balazs
收藏  |  浏览/下载：17/0  |  提交时间：2021/01/05
Reproducibility of hydraulic tomography estimates and their predictions: A two-year case study in Taiwan 期刊论文
Journal of Hydrology, 2019, 卷号: Vol.569, 页码: 117-134
作者:  Jyun-Lin Chen;  Jet-Chau Wen;  Tian-Chyi Jim Yeh;  Kun-Yi Andrew Lin;  Yu-Li Wang
收藏  |  浏览/下载：13/0  |  提交时间：2019/12/13
ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ESD Reliability Evaluations of the 60-V nLDMOS by the Drain-side Discrete SCRs 其他
2016-01-01
Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
LDMOS  
Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
LDMOS  
ESD reliability improvement of the 0.25-��m 60-V power nLDMOS with discrete embedded SCRs separated by STI structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03

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