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北京大学 [9]
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苏州纳米技术与纳米仿... [2]
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期刊论文 [21]
会议论文 [2]
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2014 [24]
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反作用飞轮的可靠性研究
期刊论文
微电机, 2014, 期号: 12, 页码: 42166
包晗
;
武俊峰
;
吴一辉
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2015/04/17
可靠性预计
故障树和故障模式
死区
并联MOSFET管
Metal-Gate Resistance with Skin Effect Consideration in Nanoscale MOSFETs for Millimeter-Wave ICs
会议论文
作者:
Lam, Sang
;
Chan, Mansun
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/12/02
metal-gate MOSFET
skin effect
nanoscale CMOS
millimeter-wave integrated circuits
gate resistance
A design of negative high voltage nanosecond pulse circuit
期刊论文
Shenzhen Daxue Xuebao (Ligong Ban)/Journal of Shenzhen University Science and Engineering, 2014, 卷号: 31, 期号: [db:dc_citation_issue], 页码: 30-34
作者:
Zhao, Xin
;
Zhang, Dongfang
;
Liu, Jinyuan
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/12/03
Electronic switch
Marx generator
Nanosecond rising time
Negative high voltage pulse
Power MOSFET
Pulse power technology
Enhancement Mode (E-Mode) AlGaN/GaN MOSFET With 10(-13) A/mm Leakage Current and 10(12) ON/OFF Current Ratio
期刊论文
ieee electron device letters, 2014
Xu, Zhe
;
Wang, Jinyan
;
Cai, Yong
;
Liu, Jingqian
;
Jin, Chunyan
;
Yang, Zhenchuan
;
Wang, Maojun
;
Yu, Min
;
Xie, Bing
;
Wu, Wengang
;
Ma, Xiaohua
;
Zhang, Jincheng
;
Hao, Yue
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2015/11/10
Post-gate annealing (PGA)
GaN
enhancement mode
MOSFET
ON/OFF current ratio
mesa isolation current
GAN MIS-HEMTS
AL2O3/GAN MOSFET
INTERFACE
Demonstration of Normally-Off Recess-Gated AlGaN/GaN MOSFET Using GaN Cap Layer as Recess Mask
期刊论文
ieee electron device letters, 2014
Xu, Zhe
;
Wang, Jinyan
;
Liu, Jingqian
;
Jin, Chunyan
;
Cai, Yong
;
Yang, Zhenchuan
;
Wang, Maojun
;
Yu, Min
;
Xie, Bing
;
Wu, Wengang
;
Ma, Xiaohua
;
Zhang, Jincheng
;
Hao, Yue
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2015/11/10
Self-terminating
normally-off
AlGaN/GaN MOSFET
GaN cap layer
gate recess
recess mask
MODE
TRANSISTORS
INTERFACE
HFET
A Comparative Study on the Impacts of Interface Traps on Tunneling FET and MOSFET
期刊论文
ieee电子器件汇刊, 2014
Qiu, Yingxin
;
Wang, Runsheng
;
Huang, Qianqian
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2015/11/10
Charge neutrality level (CNL)
high-kappa
interface trap
MOSFET
performance degradation
random trap fluctuation (RTF)
tunneling FET (TFET)
variability
FIELD-EFFECT TRANSISTORS
An analytic model for gate-all-around silicon nanowire tunneling field effect transistors
期刊论文
chinese physics b, 2014
Liu Ying
;
He Jin
;
Chan Mansun
;
Du Cai-Xia
;
Ye Yun
;
Zhao Wei
;
Wu Wen
;
Deng Wan-Ling
;
Wang Wen-Ping
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/11
gate-all-round nanowire tunneling field effect transistor
band to band tunneling
analytic model
THRESHOLD VOLTAGE
MOSFET
FETS
Derivative Superposition Numerical Method for Double-Gate MOSFET Transistor Application to RF Mixer
期刊论文
journal of computational and theoretical nanoscience, 2014
Zhu, Haifeng
;
Huang, Shuai
;
Shi, Min
;
Zhang, Wei
;
Sun, Ling
;
He, Lin
;
Zhu, Xiaoan
;
Wang, Cheng
;
He, Xiaomeng
;
Liang, Hailang
;
He, Qingxing
;
Du, Caixia
;
He, Jin
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2015/11/16
Double-Gate (DG) MOSFET
Linearity
IIP3
Device Simulation
Intermodulation Distortion
Mixer
DG-MOSFETS
LINEARITY
INVERSION
PERFORMANCE
DEVICES
MODEL
CMOS
Al2O3/AlN/GaN MOS-Channel-HEMTs With an AlN Interfacial Layer
期刊论文
ieee electron device letters, 2014
Liu, Shenghou
;
Yang, Shu
;
Tang, Zhikai
;
Jiang, Qimeng
;
Liu, Cheng
;
Wang, Maojun
;
Chen, Kevin J.
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2015/11/16
Al2O3/AlN/GaN
interfacial layer
normally off
MOS-channel-HEMT
recess
AL2O3/GAN MOSFET
PERFORMANCE
Total ionizing dose (TID) effect and single event effect (SEE) in quasi-SOI nMOSFETs
期刊论文
semiconductor science and technology, 2014
Tan, Fei
;
Huang, Ru
;
An, Xia
;
Wu, Weikang
;
Feng, Hui
;
Huang, Liangxi
;
Fan, Jiewen
;
Zhang, Xing
;
Wang, Yangyuan
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2015/11/13
quasi-SOI device
single event effect (SEE)
total ionizing dose (TID)
worst case
TECHNOLOGIES
TRANSISTOR
CANDIDATE
MOSFET
UPSET
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