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浏览/检索结果: 共9条，第1-9条 帮助 限定条件 专题：上海大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 NBTI-Aware Circuit Node Criticality Computation 期刊论文 ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS, 2013, 卷号: 9 作者:  Yang, Shengqi[1];  Wang, Wenping[2];  Hagan, Mark[3];  Zhang, Wei[4];  Gupta, Pallav[5] 收藏  |  浏览/下载：8/0  |  提交时间：2019/04/30 Negative bias temperature instability  timing analysis and optimization  node criticality computation  circuit aging and reliability  computer-aided design   A Junctionless Nanowire Transistor With a Dual-Material Gate 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 卷号: 59, 页码: 1829-1836 作者:  Lou, Haijun[1];  Zhang, Lining[2];  Zhu, Yunxi[3];  Lin, Xinnan[4];  Yang, Shengqi[5] 收藏  |  浏览/下载：2/0  |  提交时间：2019/04/30 Dual-material gate (DMG)  junctionless  nanowire  numerical simulation  single-material gate (SMG)   A Physical Design Tool for Carbon Nanotube Field-Effect Transistor Circuits 期刊论文 ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS, 2012, 卷号: 8 作者:  Huang, Jiale[1];  Zhu, Minhao[2];  Yang, Shengqi[3];  Gupta, Pallav[4];  Zhang, Wei[5] 收藏  |  浏览/下载：10/0  |  提交时间：2019/04/30 Design  Experimentation  Performance  Carbon nanotube field-effect transistor  physical design  computer-aided design  electronic design automation   Numerical Study on Effect of Random Dopant Fluctuation on Double Gate MOSFET Based 6-T SRAM Performance 会议论文 NSTI Nanotechnology Conference and Expo, 2011-06-13 作者:  Zhang, Xiufang[1];  Ma, Chenyue[2];  Zhao, Wei[3];  Zhang, Chenfei[4];  Wang, Guozeng[5] 收藏  |  浏览/下载：5/0  |  提交时间：2019/04/30 Characteristics Sensitivity of FinFET to Fin Vertical Nonuniformity 会议论文 NSTI Nanotechnology Conference and Expo, 2011-06-13 作者:  Xu, Jiaojiao[1];  Ma, Chenyue[2];  Zhang, Chenfei[3];  Zhang, Xiufang[4];  Wu, Wen[5] 收藏  |  浏览/下载：4/0  |  提交时间：2019/04/30 FinFET device  process fluctuation  vertical nonuniformity  performance variation   An HQV-Approved Edge Directed Interpolation Algorithm for De-interlacing 会议论文 2011 IEEE 54TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2011-08-07 作者:  Yang, Shengqi[1];  Zhang, Wei[2];  Zou, Jully[3] 收藏  |  浏览/下载：1/0  |  提交时间：2019/04/30 An HQV-Approved Edge Directed Interpolation Algorithm for De-interlacing 会议论文 2011 IEEE 54TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS) 作者:  Yang, Shengqi[1];  Zhang, Wei[2];  Zou, Jully[3] 收藏  |  浏览/下载：1/0  |  提交时间：2019/04/30 Case Study: Alleviating Hotspots and Improving Chip Reliability via Carbon Nanotube Thermal Interface 会议论文 Design, Automation and Test in Europe Conference (DATE), 2011-03-14 作者:  Zhang, Wei[1];  Huang, Jiale[2];  Yang, Shengqi[3];  Gupta, Pallav[4] 收藏  |  浏览/下载：4/0  |  提交时间：2019/04/30 A novel approach to simulate Fin-width Line Edge Roughness effect of FinFET performance 会议论文 2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010, 2010-12-15 作者:  Guo, Xinjie[1];  Wang, Shaodi[2];  Ma, Chenyue[3];  Zhang, Chenfei[4];  Lin, Xinnan[5] 收藏  |  浏览/下载：3/0  |  提交时间：2019/04/30