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| 扫描电镜-能谱法测定生活饮用水中石棉 期刊论文 分析试验室, 2019, 卷号: 39, 期号: 03, 页码: 303-307 作者: 刘德晔; 刘华良; 王联红; 史孝霞; 霍宗利 收藏  |  浏览/下载:12/0  |  提交时间:2021/07/16
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| Influence of rapid thermal annealing on the wafer warpage in 3D NAND flash memory 期刊论文 SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2019, 卷号: Vol.34 No.2 作者: Li, Qi; Zhang, Yu; Zou, Xingqi; Gao, Jing; Yang, Chuan 收藏  |  浏览/下载:19/0  |  提交时间:2019/12/13
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| Influence of rapid thermal annealing on the wafer warpage in 3D NAND flash memory 期刊论文 Semiconductor Science and Technology, 2019, 卷号: Vol.34 No.2, 页码: 02LT01 作者: Qi Li; Yu Zhang; Xingqi Zou; Jing Gao; Chuan Yang 收藏  |  浏览/下载:5/0  |  提交时间:2019/12/13 |
| A fast read retry method for 3D NAND flash memories using novel valley search algorithm 期刊论文 IEICE Electronics Express, 2018 作者: Huo ZL(霍宗亮); Xu QK(徐启康); Wang Q(王颀); Li QH(李前辉) 收藏  |  浏览/下载:34/0  |  提交时间:2019/05/22 |
| Word line interference based data recovery technique for 3D NAND Flash 期刊论文 IEICE Electronics Express, 2018 作者: Huo ZL(霍宗亮); Wang Q(王颀); Cao HM(曹华敏); Liu F(刘飞); Yang L(杨柳) 收藏  |  浏览/下载:16/0  |  提交时间:2019/05/22 |
| The Optimization of Gate All Around-L-Shaped Bottom Select Transistor in 3D NAND Flash Memory 期刊论文 Journal of Nanoscience and Nanotechnology, 2018 作者: Huo ZL(霍宗亮); Xia ZL(夏志良); Chen GX(陈国星); Zhang Y(张瑜); Jiang DD(姜丹丹) 收藏  |  浏览/下载:30/0  |  提交时间:2019/05/22 |
| A Novel Program Scheme for Program Disturbance Optimization in 3-D NAND Flash Memory 期刊论文 IEEE Electron Device Letters, 2018 作者: Huo ZL(霍宗亮); An Zhang; Hongtao Liu; Zou XQ(邹兴奇); Jin L(靳磊) 收藏  |  浏览/下载:13/0  |  提交时间:2019/05/22 |
| Investigation of Cycling-Induced Dummy Cell Disturbance in 3D NAND Flash Memory 期刊论文 IEEE ELECTRON DEVICE LETTERS, 2018 作者: Huo ZL(霍宗亮); Chen GX(陈国星); Zhang Y(张瑜); Jiang DD(姜丹丹); Jin L(靳磊) 收藏  |  浏览/下载:14/0  |  提交时间:2019/05/22 |
| Investigation of tunneling layer and inter-gate-dielectric engineered TaN floating gate memory 期刊论文 Integrated Ferroelectrics, 2016 作者: 存储器研发中心; Huo ZL(霍宗亮); Fu LY(付丽银); Jin L(靳磊); Jiang DD(姜丹丹) 收藏  |  浏览/下载:11/0  |  提交时间:2017/04/14 |
| Impact of Continuing Scaling on the Device Performance of 3D Cylindrical Junction-less Charge Trapping Memory 期刊论文 Journal of Semiconductors, 2015 作者: Ye TC(叶甜春); Li CL(李春龙); Tang ZY(唐兆云); Xu Q(徐强); Hong PZ(洪培真) 收藏  |  浏览/下载:16/0  |  提交时间:2016/06/03 |