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CORC

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Extraction of Ridge Lines from Grid DEMs with the Steepest Ascent Method Based on Constrained Direction 其他
2017-01-01
作者:  Jiang, Wenping;  Xi, Daping;  Deng, Xiaolong;  Huang, Lina;  Ying, Shen
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/05
Extraction of Ridge Lines from Grid DEMs with the Steepest Ascent Method Based on Constrained Direction 其他
2017-01-01
作者:  Jiang, Wenping;  Xi, Daping;  Deng, Xiaolong;  Huang, Lina;  Ying, Shen
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/05
ESD Reliability Improvement of the 0.25-mu m 60-V Power nLDMOS with Discrete Embedded SCRs Separated by STI Structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
ESD Reliability Evaluations of the 60-V nLDMOS by the Drain-side Discrete SCRs 其他
2016-01-01
Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
LDMOS  
Design on ESD Robustness of Source-side Discrete Distribution in the 60-V High-Voltage nLDMOS Devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
LDMOS  
ESD reliability improvement of the 0.25-��m 60-V power nLDMOS with discrete embedded SCRs separated by STI structures 其他
2016-01-01
Chen, Shen-Li; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Chen, Hung-Wei
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
ESD-reliability characterizations of a 45-V p-channel LDMOS-SCR with the discrete-cathode end 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices 其他
2016-01-01
Chen, Shen-Li; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
ESD reliability evaluations of the 60-V nLDMOS by the drain-side discrete SCRs 其他
2016-01-01
Chen, Shen-Li; Chen, Kuei-Jyun; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
ESD-Reliability Characterizations of a 45-V p-Channel LDMOS-SCR with the Discrete-Cathode End 其他
2016-01-01
Chen, Shen-Li; Huang, Yu-Ting; Wu, Yi-Cih; Lin, Jia-Ming; Yang, Chih-Hung; Yen, Chih-Ying; Chen, Kuei-Jyun
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03

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