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科研机构
北京大学 [23]
上海电子信息职业技术... [1]
武汉大学 [1]
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其他 [25]
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2019 [1]
2016 [2]
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RETRACTION: Up-regulation of CDK16 by multiple mechanisms in hepatocellular carcinoma promotes tumor progression (Retraction of Vol 36, Pg 97, 2017)
其他
2019-01-01
作者:
Wang, Yitao
;
Qin, Xian
;
Guo, Tao
;
Liu, Pengpeng
;
Wu, Ping
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2019/12/05
Too Noisy at the Nanoscale?-The Rise of Random Telegraph Noise (RTN) in Devices and Circuits
其他
2016-01-01
Wang, Runsheng
;
Guo, Shaofeng
;
Ren, Pengpeng
;
Luo, Mulong
;
Zou, Jibin
;
Hang, Ru
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Random telegraph noise (RTN)
MOSFET
VARIABILITY
RELIABILITY
MOSFETS
IMPACT
On the Frequency Dependence of Oxide Trap Coupling in Nanoscale MOSFETs: Understanding based on Complete 4-State Trap Model
其他
2016-01-01
Peng Hao
;
Dongyuan Mao
;
Runsheng Wang
;
Shaofeng Guo
;
Pengpeng Ren
;
Ru Huang
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Trap
explanation
interpretation
verified
switching
discharged
thoroughly
capture
tendency
metastable
Trap
explanation
interpretation
verified
switching
discharged
thoroughly
capture
tendency
metastable
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era
其他
2015-01-01
Ren, Pengpeng
;
Wang, Runsheng
;
Ji, Zhigang
;
Hao, Peng
;
Jiang, Xiaobo
;
Guo, Shaofeng
;
Luo, Mulong
;
Duan, Meng
;
Zhang, Jian F.
;
Wang, Jianping
;
Liu, Jinhua
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Xu, Nuo
;
Huang, Ru
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits
其他
2015-01-01
Zou, Jibin
;
Wang, Runsheng
;
Guo, Shaofeng
;
Luo, Mulong
;
Yu, Zhuoqing
;
Jiang, Xiaobo
;
Ren, Pengpeng
;
Wang, Jianping
;
Liu, Jinhua
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Shaofeng
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Wang, Yangyuan
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2017/12/03
DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design
其他
2015-01-01
Guo, Shaofeng
;
Huang, Ru
;
Hao, Peng
;
Luo, Mulong
;
Ren, Pengpeng
;
Wang, Jianping
;
Bu, Weihai
;
Wu, Jingang
;
Wong, Waisum
;
Yu, Scott
;
Wu, Hanming
;
Lee, Shiuh-Wuu
;
Wang, Runsheng
;
Wang, Yangyuan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/12/03
New Framework for the random charging/discharging of oxide traps in HfO2 gate dielectric: Ab-initio simulation and experimental evidence
其他
2015-01-01
Ji, Jingwei
;
Qiu, Yingxin
;
Guo, Shaofeng
;
Wang, Runsheng
;
Ren, Pengpeng
;
Hao, Peng
;
Huang, Ru
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2017/12/03
Understanding NBTI-induced dynamic variability in the nano-reliability Era: From devices to circuits
其他
2015-01-01
Wang, Runsheng
;
Ren, Pengpeng
;
Liu, Changze
;
Guo, Shaofeng
;
Huang, Ru
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
Understanding NBTI-induced Dynamic Variability in the nano-Reliability Era: from Devices to Circuits
其他
2015-01-01
Wang, Runsheng
;
Ren, Pengpeng
;
Liu, Changze
;
Guo, Shaofeng
;
Huang, Ru
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2017/12/03
New Efficient Method for Characterizing Time Constants of Switching Oxide Traps
其他
2014-01-01
Guo, Shaofeng
;
Ren, Pengpeng
;
Wang, Runsheng
;
Yu, Zhuoqing
;
Luo, Mulong
;
Zhang, Xing
;
Huang, Ru
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2015/11/13
MOSFETs
switching oxide traps
time constants
characterizing method
MC simulation
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