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	On the Frequency Dependence of Oxide Trap Coupling in Nanoscale MOSFETs: Understanding based on Complete 4-State Trap Model; On the Frequency Dependence of Oxide Trap Coupling in Nanoscale MOSFETs: Understanding based on Complete 4-State Trap Model
	Peng Hao ; Dongyuan Mao ; Runsheng Wang ; Shaofeng Guo ; Pengpeng Ren ; Ru Huang
	2016
关键词	Trap explanation interpretation verified switching discharged thoroughly capture tendency metastable Trap explanation interpretation verified switching discharged thoroughly capture tendency metastable
英文摘要	The frequency dependence of oxide trap coupling effect in nanoscale MOSFETs under AC switching condition is discussed thoroughly, with experimental and theoretical studies. By using AC STR measurement, a decreased tendency of trap coupling strength with increased frequency is observed. Rather than conventional 2-state trap model, it is found that only the explanation based on complete 4-state trap model is a reasonable interpretation, verified by Monte-Carlo simulation. The impacts of trap coupling frequency characteristics on digital circuits are also evaluated, showing a frequency-dependent underestimation of transient circuit performance if ignoring the above effect.; The frequency dependence of oxide trap coupling effect in nanoscale MOSFETs under AC switching condition is discussed thoroughly, with experimental and theoretical studies. By using AC STR measurement, a decreased tendency of trap coupling strength with increased frequency is observed. Rather than conventional 2-state trap model, it is found that only the explanation based on complete 4-state trap model is a reasonable interpretation, verified by Monte-Carlo simulation. The impacts of trap coupling frequen; IEEE Beijing Section; 3
语种	英语
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/479774]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Peng Hao,Dongyuan Mao,Runsheng Wang,et al. On the Frequency Dependence of Oxide Trap Coupling in Nanoscale MOSFETs: Understanding based on Complete 4-State Trap Model, On the Frequency Dependence of Oxide Trap Coupling in Nanoscale MOSFETs: Understanding based on Complete 4-State Trap Model. 2016-01-01.

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