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Insight into PBTI in InGaAs Nanowire FETs with Al2O3 and LaAlO3 Gate Dielectrics 其他
2016-01-01
Li, Y.; Di, S. Y.; Jiang, H.; Huang, P.; Wang, Y. J.; Lun, Z. Y.; Shen, L.; Yin, L. X.; Zhang, X.; Du, G.; Liu, X. Y.
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
An Investigation of DC/AC Hot Carrier Degradation in Multiple-fin SOI FinFETs 其他
2015-01-01
Jiang, H.; Liu, X. Y.; Xu, N.; He, Y. D.; Du, G.; Zhang, X.
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
An Investigation of DC/AC hot carrier degradation in multiple-fin SOI FinFETs 其他
2015-01-01
Jiang, H.; Liu, X.Y.; Xu, N.; He, Y.D.; Du, G.; Zhang, X.
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Research on High-Speed Data Acquisition and Real-Time Signal Processing Method Based on Tunable Diode Laser Spectroscopy 其他
2015-01-01
Du, X. F.; Dong, D. M.; Jiao, L. Z.; Han, P. C.; Lang, Y.
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03
Analytic Model of Endurance Degradation and Its Practical Applications for Operation Scheme Optimization in Metal Oxide Based RRAM 其他
2013-01-01
Huang, P.; Chen, B.; Wang, Y. J.; Zhang, F. F.; Shen, L.; Liu, R.; Zeng, L.; Du, G.; Zhang, X.; Gao, B.; Kang, J. F.; Liu, X. Y.; Wang, X. P.; Weng, B. B.; Tang, Y. Z.; Lo, G-Q.; Kwong, D.L.
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
A Physical Based Analytic Model of RRAM Operation for Circuit Simulation 其他
2012-01-01
Huang, P.; Liu, X. Y.; Li, W. H.; Deng, Y. X.; Chen, B.; Lu, Y.; Gao, B.; Zeng, L.; Wei, K. L.; Du, G.; Zhang, X.; Kang, J. F.
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
High performance unipolar AlOy/HfOx/Ni based RRAM compatible with Si diodes for 3D application 其他
2011-01-01
Tran, X.A.; Gao, B.; Kang, J.F.; Wu, L.; Wang, Z.R.; Fang, Z.; Pey, K.L.; Yeo, Y.C.; Du, A.Y.; Nguyen, B.Y.; Li, M.F.; Yu, H.Y.
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Evaluating the effects of physical mechanisms on the program, erase and retention in the charge trapping memory 其他
2008-01-01
Song, Y.C.; Liu, X.Y.; Wang, Z.Y.; Zhao, K.; Du, G.; Kang, J.F.; Han, R.Q.; Xia, Z.L.; Kim, D.; Lee, K.-H.
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/10
Evaluating the Effects of Physical Mechanisms on the Program, Erase and Retention in the Charge Trapping Memory 其他
2008-01-01
Song, Y. C.; Liu, X. Y.; Wang, Z. Y.; Zhao, K.; Du, G.; Kang, J. F.; Han, R. Q.; Xia, Z. L.; Kim, D.; Lee, K-H
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Simulation of Charge Trapping Memory with Novel Structures 其他
2008-01-01
Liu, X. Y.; Song, Y. C.; Du, Gang; Han, R. Q.; Xia, Z. L.; Kim, D.; Lee, K-H
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13


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