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A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 会议论文
作者:  Yan, Weiwei;  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi
收藏  |  浏览/下载:40/0  |  提交时间:2018/08/20
A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 437-442
作者:  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi;  Khan, Maaz
收藏  |  浏览/下载:35/0  |  提交时间:2018/05/31


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