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The effects of process condition of Top-TiN and TaN thickness on the effective work function of MOSCAP with high-k/metal gate stacks 期刊论文
Journal of Semiconductors, 2014
作者:  Chen DP(陈大鹏);  Ma XL(马雪丽);  Yang H(杨红);  Wang WW(王文武);  Yin HX(殷华湘)
收藏  |  浏览/下载:10/0  |  提交时间:2015/05/06
An effective work-function tuning method of nMOSCAP with high-k/metal gate by TiN/TaN double-layer stack thickness 期刊论文
Journal of Semiconductors, 2014
作者:  Chen DP(陈大鹏);  Ma XL(马雪丽);  Yang H(杨红);  Wang WW(王文武);  Yin HX(殷华湘)
收藏  |  浏览/下载:12/0  |  提交时间:2015/05/06
Integration of highly-strained SiGe materials in 14nm and beyond nodes FinFET technology 期刊论文
Solid-State Electronics, 2014
作者:  Li JF(李俊峰);  Wang GL(王桂磊);  Luo J(罗军);  Guo YL(郭奕栾);  Chen T(陈韬)
收藏  |  浏览/下载:6/0  |  提交时间:2015/04/24
Study of Hetero-Tunneling gFET with an Ultra-shallow Pocket Junction 会议论文
作者:  
收藏  |  浏览/下载:15/0  |  提交时间:2015/05/07
Study of Si Green Transistor with an Ultra-shallow Pocket Junction 会议论文
作者:  Li CL(李春龙);  Li JJ(李俊杰);  Xu GB(许高博);  Xu QX(徐秋霞);  Yin HX(殷华湘)
收藏  |  浏览/下载:13/0  |  提交时间:2015/05/07


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