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A fully three-dimensional atomistic quantum mechanical study on random dopant-induced effects in 25-nm MOSFETs 期刊论文
ieee transactions on electron devices, 2008, 卷号: 55, 期号: 7, 页码: 1720-1726
Jiang, XW; Deng, HX; Luo, JW; Li, SS; Wang, LW
收藏  |  浏览/下载:153/1  |  提交时间:2010/03/08
Multiple valley couplings in nanometer Si metal-oxide-semiconductor field-effect transistors 期刊论文
journal of applied physics, 2008, 卷号: 103, 期号: 12, 页码: art. no. 124507
Deng, HX; Jiang, XW; Luo, JW; Li, SS; Xia, JB; Wang, LW
收藏  |  浏览/下载:65/5  |  提交时间:2010/03/08


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